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Time-of-Flight-type Photoelectron Emission Microscopy with a 10.9-eV Laser
Article
Creator
Shunsuke Tsuda
;
Koichiro Yaji
Keyword
Photoemission spectroscopy
,
Momentum microscope
,
Electronic property
,
Time of flight
,
Ultraviolet laser
Date published
2024-02-17
Updated at
2024-08-30 12:30:26 +0900
Keyword
Momentum microscope
(1)
Electronic property
(1)
Photoemission spectroscopy
(1)
Time of flight
(1)
Ultraviolet laser
(1)
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