Article Time-of-Flight-type Photoelectron Emission Microscopy with a 10.9-eV Laser

Shunsuke Tsuda SAMURAI ORCID (National Institute for Materials Science) ; Koichiro Yaji SAMURAI ORCID (National Institute for Materials Science)

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Shunsuke Tsuda, Koichiro Yaji. Time-of-Flight-type Photoelectron Emission Microscopy with a 10.9-eV Laser. e-Journal of Surface Science and Nanotechnology. 2024, 22 (2), 2024-005. https://doi.org/10.1380/ejssnt.2024-005
SAMURAI

Description:

(abstract)

We have developed a novel photoemission microscopy apparatus employing a vacuum ultraviolet laser. This setup combines photoemission electron microscopy (PEEM) with a time-of-flight detector, facilitating rapid visualization of electronic states in both real and momentum space. Achieving a spatial resolution of 70 nm, attributed to the PEEM lens system, we showcase the full band mapping of a Bi(111) single crystal film using angle-resolved photoemission spectroscopy within a short acquisition time.

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Keyword: Photoemission spectroscopy, Momentum microscope, Electronic property, Time of flight, Ultraviolet laser

Date published: 2024-02-17

Publisher: Surface Science Society Japan

Journal:

  • e-Journal of Surface Science and Nanotechnology (ISSN: 13480391) vol. 22 issue. 2 p. 170-173 2024-005

Funding:

  • JSPS JP21K04633
  • JSPS JP22H01761
  • Iketani Science and Technology Foundation
  • ALTA JPJ004596

Manuscript type: Publisher's version (Version of record)

MDR DOI:

First published URL: https://doi.org/10.1380/ejssnt.2024-005

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Updated at: 2024-08-30 12:30:26 +0900

Published on MDR: 2024-08-30 12:30:26 +0900

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