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説明:

We have developed a novel photoemission microscopy apparatus employing a vacuum ultraviolet laser. This setup combines photoemission electron microscopy (PEEM) with a time-of-flight detector, facilitating rapid visualization of electronic states in both real and momentum space. Achieving a spatial resolution of 70 nm, attributed to the PEEM lens system, we showcase the full band mapping of a Bi(111) single crystal film using angle-resolved photoemission spectroscopy within a short acquisition time.

権利情報:

• Creative Commons BY Attribution 4.0 International
  

キーワード: Photoemission spectroscopy, Momentum microscope, Electronic property, Time of flight, Ultraviolet laser

刊行年月日: 2024-02-17

出版者: Surface Science Society Japan

掲載誌:

• e-Journal of Surface Science and Nanotechnology (ISSN: 13480391) vol. 22 issue. 2 p. 170-173 2024-005

研究助成金:

• JSPS JP21K04633
• JSPS JP22H01761
• Iketani Science and Technology Foundation
• ALTA JPJ004596

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1380/ejssnt.2024-005

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更新時刻: 2024-08-30 12:30:26 +0900

MDRでの公開時刻: 2024-08-30 12:30:26 +0900