2 records found.
Robust Preparation of Sub‐20‐nm‐Thin Lamellae for Aberration‐Corrected Electron Microscopy
- Article
- Creator
-
Hideyo Tsurusawa
;
Jun Uzuhashi
;
Yusuke Kozuka
;
Koji Kimoto
;
Tadakatsu Ohkubo
- Keyword
- TEM, FIB, Automation
- Date published
- 2024-02-22
- Updated at
- 2024-05-03 08:30:11 +0900
In-depth S/TEM observation of Ti–Hf and Ta–Hf-doped Nb3Sn layers
- Article
- Creator
-
Nobuya Banno
;
Taku Moronaga
;
Toru Hara
;
Koki Asai
;
Tsuyoshi Yagai
- Keyword
- Nb3Sn, Hf doping, ACOM-TEM, TEM, grain growth
- Date published
- 2024-03-01
- Updated at
- 2025-02-14 12:31:24 +0900