Keyword: GaAs(110)
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s-info3.pdf
Quantitative theoretical analysis of the electrostatic force between a metallic tip and semiconductor surface in Kelvin probe force microscopy
Article
Creator
Nobuyuki Ishida SAMURAI ORCID ; Takaaki Mano SAMURAI ORCID
Keyword
Kelvin probe force microscopy, Simulation, GaAs(110)
Date published
2025-02-17
Updated at
2025-12-03 08:30:21 +0900
draft01.pdf
Quantitative characterization of built-in potential profile across GaAs p–n junctions using Kelvin probe force microscopy with qPlus sensor AFM
Article
Creator
Nobuyuki Ishida SAMURAI ORCID ; Takaaki Mano SAMURAI ORCID
Keyword
GaAs(110), Kelvin probe force microscopy, p-n junction, qPlus sensor
Date published
2024-02-05
Updated at
2024-04-04 08:30:11 +0900