Interfacial Elemental Analysis of Slanted Edge-Contacted Monolayer MoS₂ Transistors via Directionally Angled Etching

Journal article

Creator

Chia-Chun Lin (author) (Search by this author)

Chia-Chun Lin ;

Naomi Tabudlong Paylaga (author) (Search by this author)

Naomi Tabudlong Paylaga ;

Chun-Chieh Yen (author) (Search by this author)

Chun-Chieh Yen ;

Yu-Hsuan Lin (author) (Search by this author)

Yu-Hsuan Lin ;

Kuang-Hsu Wang (author) (Search by this author)

Kuang-Hsu Wang ;

Kenji Watanabe (author) (Search by this author)

https://orcid.org/0000-0003-3701-8119

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Kenji Watanabe ;

Takashi Taniguchi (author) (Search by this author)

https://orcid.org/0000-0002-1467-3105

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Takashi Taniguchi ;

Chi-Te Liang (author) (Search by this author)

Chi-Te Liang ;

Shao-Yu Chen (author) (Search by this author)

Shao-Yu Chen ;

Wei-Hua Wang (author) (Search by this author)

Wei-Hua Wang

Keyword

edge contacts
, MoS2 transistors
, interfacial analysis

Date published

2025-02-04

Updated at

2026-03-10 12:30:24 +0900