Resource type: journal_article Keyword: qPlus sensor
Reset all filters

1 record found.

draft01.pdf
Quantitative characterization of built-in potential profile across GaAs p–n junctions using Kelvin probe force microscopy with qPlus sensor AFM
Article
Creator
Nobuyuki Ishida SAMURAI ORCID ; Takaaki Mano SAMURAI ORCID
Keyword
GaAs(110), Kelvin probe force microscopy, p-n junction, qPlus sensor
Date published
2024-02-05
Updated at
2024-04-04 08:30:11 +0900