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A low-temperature ultrahigh-vacuum scanning probe microscope with in situ electronic transport capabilities: From macro to nano in 10 minutes
- Journal article
- Creator
-
;Diego Expósito (author) (Search by this author)Oscar Custance (author) (Search by this author)National Institute for Materials Science
;
Iván Brihuega (author) (Search by this author) - Keyword
- ultrahigh vacuum, low-temperature, scanning probe microscope, electrical transport measurements, atomic scale imaging, graphene devices
- Date published
- 2026-09-01
- Updated at
- 2026-09-24 11:28:58 +0900