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We have developed a low temperature, ultrahigh-vacuum (UHV) system that combines two complementary techniques, scanning probe microscopy (SPM) and electrical transport measurements, within a single platform. By providing simultaneous access to the atomic-scale surface landscape and the macroscopic device response of the same sample, the setup enables direct correlations between local structural/spectroscopic signatures and global electronic transport behavior in two-dimensional devices. The system allows experiments where atomic-scale modifications or controlled manipulations are performed while continuously monitoring their impact on device-scale performance. The setup consists of two interconnected UHV chambers: a dedicated preparation chamber and a separate measurement chamber that houses a liquid-helium cryostat and the SPM/transport stage. Base pressure is 1 × 10 −11 Torr. A key feature is direct optical access to the sample, enabling rapid and reliable tip positioning with an accuracy of 5 × 5 μm 2 within 10 min. The SPM, operated using custom-built electronics, can track the exact same sample region across a temperature range from 2.9 to 400 K, with mechanical stability below 1 pm. System performance is demonstrated on graphene devices, and bulk Pb is used to determine energy resolution. Using superconducting tips, scanning tunneling spectroscopy measures the superconducting gap with an energy resolution of 30 μV. Transport measurements track the temperature dependence of both resistivity and critical current across the superconducting transition of an in situ prepared Pb nanowire.

権利情報:

• In Copyright
  

  This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in (citation of published article) and may be found at https://doi.org/10.1063/5.0336684.

キーワード: ultrahigh vacuum, low-temperature, scanning probe microscope, electrical transport measurements, atomic scale imaging, graphene devices

刊行年月日: 2026-09-01

出版者: AIP Publishing

掲載誌:

• Review of Scientific Instruments (ISSN: 00346748) vol. 97 issue. 9 093701

研究助成金:

• Ministerio de Ciencia, Innovación y Universidades PID2023-149106NB-I00
• Comunidad de Madrid Recovery Transformation and Resilience Plan [Materiales Disruptivos Bidimensionales (2D)
• Comunidad de Madrid (MAD2DCM)]
• NextGenerationEU Artificial Quantum Matter: From 2D Materials to Spin Lattice Systems
• Fundación BBVA Artificial Quantum Matter: From 2D Materials to Spin Lattice Systems

原稿種別: 著者最終稿 (Accepted manuscript)

MDR DOI: https://doi.org/10.48505/nims.6531

公開URL: https://doi.org/10.1063/5.0336684

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更新時刻: 2026-09-24 11:28:58 +0900

MDRでの公開時刻: 2026-09-24 12:43:04 +0900