2 records found.
Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry
- Article
- Creator
-
Ralfy Kenaz
;
Saptarshi Ghosh
;
Pradheesh Ramachandran
;
Kenji Watanabe
;
Takashi Taniguchi
;
Hadar Steinberg
;
Ronen Rapaport
- Keyword
- Spectroscopic ellipsometry, thickness mapping, transition metal dichalcogenides
- Date published
- 2023-05-23
- Updated at
- 2025-02-14 12:30:58 +0900
Optical constants of MgxZn1-xO
- Dataset
- Creator
-
Yusuke Kozuka
- Keyword
- Optical constants, Spectroscopic ellipsometry, Zinc oxide
- Date published
- 2025-04-06
- Updated at
- 2025-04-08 11:27:45 +0900