2 records found.
Defect engineering-induced Seebeck coefficient and carrier concentration decoupling in CuI by noble gas ion implantation
- Journal article
- Creator
-
Martin Markwitz (author) (Search by this author)
https://orcid.org/0009-0007-6516-3571
(unauthenticated)
;
Peter P. Murmu (author) (Search by this author)
https://orcid.org/0000-0002-0109-1798
(unauthenticated)
;
Takao Mori (author) (Search by this author)
;
John V. Kennedy (author) (Search by this author)
https://orcid.org/0000-0002-9126-4997
(unauthenticated)
;
Ben J. Ruck (author) (Search by this author)
https://orcid.org/0000-0002-3719-7375
(unauthenticated)
- Keyword
- thermoelectric
- Date published
- 2024-11-18
- Updated at
- 2024-11-25 16:30:11 +0900
Defect and dopant complex mediated high power factor in transparent selenium-doped copper iodide thin films
- Journal article
- Creator
-
;Peter P. Murmu (author) (Search by this author);Martin Markwitz (author) (Search by this author);Shen V. Chong (author) (Search by this author);Niall Malone (author) (Search by this author)Takao Mori (author) (Search by this author)National Institute for Materials Science
;
;Himanshu Vyas (author) (Search by this author);L. John Kennedy (author) (Search by this author);Sergey Rubanov (author) (Search by this author);Clastinrusselraj Indirathankam Sathish (author) (Search by this author);Jiabao Yi (author) (Search by this author)John V. Kennedy (author) (Search by this author)
https://orcid.org/0000-0002-9126-4997
(unauthenticated)
- Keyword
- thermoelectric
- Date published
- 2024-06-29
- Updated at
- 2024-10-08 12:30:41 +0900