3 records found.
Evaluation of in-plane and out-of-plane crystallinities with residual amorphous phases for MgB2 superconductor
- Journal article
- Creator
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Minoru Maeda (author) (Search by this author)
https://orcid.org/0000-0001-7472-1167
(unauthenticated)
;
Jun Hyuk Choi (author) (Search by this author)
https://orcid.org/0009-0009-8180-0993
(unauthenticated)
;
Dong Gun Lee (author) (Search by this author)
https://orcid.org/0009-0009-9902-7863
(unauthenticated)
;
;Akiyoshi Matsumoto (author) (Search by this author)Gen Nishijima (author) (Search by this author)
;
;Zhenan Jiang (author) (Search by this author);Nicholas M. Strickland (author) (Search by this author)Jung Ho Kim (author) (Search by this author)
https://orcid.org/0000-0003-4931-3553
(unauthenticated)
;
Seyong Choi (author) (Search by this author) - Keyword
- Anysotropy, Disorder, MgB2, X-ray diffraction
- Date published
- 2024-07-01
- Updated at
- 2024-11-13 08:31:23 +0900
Structural ordering of SiO<sub>2</sub> glass exhibiting different fictive temperatures
- Journal article
- Creator
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;Hirokazu Masai (author) (Search by this author)Yohei Onodera (author) (Search by this author)National Institute for Materials Science
;
;Yasuhiro Fujii (author) (Search by this author);Hideaki Hagihara (author) (Search by this author);Kazuya Saito (author) (Search by this author);Edison Sekiya (author) (Search by this author);Nanami Misawa (author) (Search by this author);Akitoshi Koreeda (author) (Search by this author)Shinji Kohara (author) (Search by this author)National Institute for Materials Science
- Keyword
- SiO2 glass, Fictive temperature, X-ray diffraction, Neutron diffraction, Spectroscopy
- Date published
- 2026-04-01
- Updated at
- 2026-04-03 10:04:31 +0900
Surface Structure Modulation of La0.6Sr0.4CoO3 Films on SrTiO3 (001) Substrate under Electrochemical Conditions
- Journal article
- Creator
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;Atsuro Fujisawa (author) (Search by this author)Graduate School of Science, Tohoku University;Xuhui Xu (author) (Search by this author)Graduate School of Science, Tohoku UniversityYuta Ishii (author) (Search by this author)Center for Basic Research on Materials/Advanced Materials Characterization Field/Synchrotron Radiation Imaging Group, National Institute for Materials Science
;
;Hidekazu Shimotani (author) (Search by this author)Graduate School of Science, Tohoku University;Yuta Inoue (author) (Search by this author)Kyoto Univeristy;Yuto Miyahara (author) (Search by this author)Kyoto Univeristy;Kohei Miyazaki (author) (Search by this author)Kyoto UniveristyYusuke Wakabayashi (author) (Search by this author)Graduate School of Science, Tohoku University
- Keyword
- transition metal oxide surfaces, thin films, surface structure, water electrolysis, X-ray diffraction, in situ measurements
- Date published
- 2025-10-15
- Updated at
- 2025-10-21 16:05:35 +0900