Electrical activity of Mg clustering at nanoscale defects induced by N ion implantation in GaN

Journal article

Creator

Kosuke Ishikawa (author) (Search by this author)

Kosuke Ishikawa ;

Emi Kano (author) (Search by this author)

https://orcid.org/0000-0001-6134-4980 (unauthenticated)

Emi Kano ;

Jun Uzuhashi (author) (Search by this author)

https://orcid.org/0000-0003-2023-8158

NIMS Researchers Directory SAMURAI

Jun Uzuhashi ;

Kensuke Sumida (author) (Search by this author)

Kensuke Sumida ;

Tetsuo Narita (author) (Search by this author)

https://orcid.org/0000-0002-0849-360X (unauthenticated)

Tetsuo Narita ;

Masahiro Horita (author) (Search by this author)

https://orcid.org/0000-0003-0008-6732 (unauthenticated)

Masahiro Horita ;

Junya Sahashi (author) (Search by this author)

Junya Sahashi ;

Shun Lu (author) (Search by this author)

https://orcid.org/0000-0002-7342-757X (unauthenticated)

Shun Lu ;

Jun Suda (author) (Search by this author)

https://orcid.org/0000-0002-5453-4943 (unauthenticated)

Jun Suda ;

Tadakatsu Ohkubo (author) (Search by this author)

https://orcid.org/0000-0003-3548-1951

NIMS Researchers Directory SAMURAI

Tadakatsu Ohkubo ;

Tetsu Kachi (author) (Search by this author)

https://orcid.org/0000-0002-4300-5720 (unauthenticated)

Tetsu Kachi ;

Nobuyuki Ikarashi (author) (Search by this author)

https://orcid.org/0000-0002-5575-5780 (unauthenticated)

Nobuyuki Ikarashi

Keyword

gallium nitride, atom probe tomography

Date published

2026-06-22

Updated at

2026-06-25 09:46:49 +0900