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Journal article(2)
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gallium nitride (2)
atom probe tomography (1)
cathodoluminescence (1)
implantation (1)
scanning transmission electron microscopy (1)
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Creative Commons BY Attribution 4.0 International (1)
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Keyword: gallium nitride
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Atomic-scale investigation of implanted Mg in GaN through ultra-high-pressure annealing
Journal article
Creator
Jun Uzuhashi
(author) (
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https://orcid.org/0000-0003-2023-8158
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Jun Chen
(author) (
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https://orcid.org/0000-0003-4272-2653
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Jun Chen
;
Ashutosh Kumar
(author) (
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https://orcid.org/0000-0002-8085-1598
(unauthenticated)
National Institute for Materials Science
Ashutosh Kumar
;
Wei Yi
(author) (
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https://orcid.org/0000-0001-5040-8416
(unauthenticated)
National Institute for Materials Science
Wei Yi
;
Tadakatsu Ohkubo
(author) (
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https://orcid.org/0000-0003-3548-1951
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Ryo Tanaka
(author) (
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Ryo Tanaka
;
Shinya Takashima
(author) (
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Shinya Takashima
;
Masaharu Edo
(author) (
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Masaharu Edo
;
Kacper Sierakowski
(author) (
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Kacper Sierakowski
;
Michal Bockowski
(author) (
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Michal Bockowski
;
Hideki Sakurai
(author) (
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Hideki Sakurai
;
Tetsu Kachi
(author) (
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Tetsu Kachi
;
Takashi Sekiguchi
(author) (
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https://orcid.org/0000-0002-7365-9979
(unauthenticated)
National Institute for Materials Science
Takashi Sekiguchi
;
Kazuhiro Hono
(author) (
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https://orcid.org/0000-0001-7367-0193
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Kazuhiro Hono
Keyword
gallium nitride
,
implantation
,
atom probe tomography
,
cathodoluminescence
,
scanning transmission electron microscopy
Date published
2022-05-14
Updated at
2024-01-05 22:11:22 +0900
Vacancy‐Type Defects and Their Trapping/Detrapping of Charge Carriers in Ion‐Implanted GaN Studied by Positron Annihilation
Journal article
Creator
Akira Uedono
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https://orcid.org/0000-0001-6224-4869
(unauthenticated)
Akira Uedono
;
Ryo Tanaka
(author) (
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https://orcid.org/0000-0002-4058-7649
(unauthenticated)
Ryo Tanaka
;
Shinya Takashima
(author) (
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https://orcid.org/0000-0002-3212-4521
(unauthenticated)
Shinya Takashima
;
Katsunori Ueno
(author) (
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Katsunori Ueno
;
Masaharu Edo
(author) (
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Masaharu Edo
;
Kohei Shima
(author) (
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https://orcid.org/0000-0003-0967-141X
(unauthenticated)
Kohei Shima
;
Shigefusa F. Chichibu
(author) (
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https://orcid.org/0000-0001-9558-1642
(unauthenticated)
Shigefusa F. Chichibu
;
Jun Uzuhashi
(author) (
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https://orcid.org/0000-0003-2023-8158
NIMS Researchers Directory SAMURAI
Jun Uzuhashi
;
Tadakatsu Ohkubo
(author) (
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https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
Tadakatsu Ohkubo
;
Shoji Ishibashi
(author) (
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https://orcid.org/0000-0002-4896-3530
(unauthenticated)
Shoji Ishibashi
;
Kacper Sierakowski
(author) (
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https://orcid.org/0000-0002-9447-1182
(unauthenticated)
Kacper Sierakowski
;
Michal Bockowski
(author) (
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https://orcid.org/0000-0003-1616-685X
(unauthenticated)
Michal Bockowski
Keyword
gallium nitride
Date published
2024-02-29
Updated at
2025-03-01 12:30:45 +0900
Keyword
gallium nitride
(2)
atom probe tomography
(1)
cathodoluminescence
(1)
implantation
(1)
scanning transmission electron microscopy
(1)
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Journal article(2)
Keyword
gallium nitride (2)
atom probe tomography (1)
cathodoluminescence (1)
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scanning transmission electron microscopy (1)
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Creative Commons BY Attribution 4.0 International (1)
In Copyright (1)
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