2 records found.
In-depth S/TEM observation of Ti–Hf and Ta–Hf-doped Nb3Sn layers
- Journal article
- Creator
-
Nobuya Banno (author) (Search by this author)National Institute for Materials Science
;
Taku Moronaga (author) (Search by this author)National Institute for Materials Science
;
Toru Hara (author) (Search by this author)National Institute for Materials Science
;
;Koki Asai (author) (Search by this author)Tsuyoshi Yagai (author) (Search by this author)
https://orcid.org/0000-0003-1842-7881
(unauthenticated)
- Keyword
- Nb3Sn, Hf doping, ACOM-TEM, TEM, grain growth
- Date published
- 2024-03-01
- Updated at
- 2025-02-14 12:31:24 +0900
Characterization of Japan's DEMO Candidate Reinforced Nb3Sn Wires Under Crossover Contact Stress
- Journal article
- Creator
-
Nobuya Banno (author) (Search by this author)
;
;Toshihisa Asano (author) (Search by this author)Tsuyoshi Yagai (author) (Search by this author)
https://orcid.org/0000-0003-1842-7881
(unauthenticated)
;
Shinya Kawashima (author) (Search by this author)
https://orcid.org/0000-0001-5282-4720
(unauthenticated)
;
Masahiro Sugimoto (author) (Search by this author)
https://orcid.org/0000-0002-7752-4617
(unauthenticated)
;
Satoshi Awaji (author) (Search by this author)
https://orcid.org/0000-0003-2043-1628
(unauthenticated)
;
Hiroyasu Utoh (author) (Search by this author)
https://orcid.org/0000-0002-0936-210X
(unauthenticated)
;
Yoshiteru Sakamoto (author) (Search by this author)
https://orcid.org/0000-0002-5396-9654
(unauthenticated)
- Keyword
- Crossover contact stress, DEMO, Nb3Sn, Reinforcement
- Date published
- 2024-02-06
- Updated at
- 2026-02-06 08:30:08 +0900