Effects of metal doping on defect dynamics in graphene: In situ TEM observation and persistent homology-based structural analysis

Journal article

Creator

Ryuto Eguchi (author) (Search by this author)

https://orcid.org/0009-0003-2859-6934

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Ryuto Eguchi ;

Ayako Hashimoto (author) (Search by this author)

https://orcid.org/0000-0002-1985-7667

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Ayako Hashimoto

Keyword

Data analysis, Image processing, Electron radiation effects, Graphene, Transmission electron microscopy, Algebraic topology, Doping

Date published

2026-07-13

Updated at

2026-10-15 13:12:49 +0900