Optical detection of charge defects near a graphene transistor using the Stark shift of fluorescent molecules

Journal article

Creator

Carlotta Ciancico (author) (Search by this author)

Carlotta Ciancico ;

Iacopo Torre (author) (Search by this author)

Iacopo Torre ;

Bernat Terrés (author) (Search by this author)

Bernat Terrés ;

Alvaro Moreno (author) (Search by this author)

Alvaro Moreno ;

Robert Smit (author) (Search by this author)

Robert Smit ;

Kenji Watanabe (author) (Search by this author)

https://orcid.org/0000-0003-3701-8119

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Kenji Watanabe ;

Takashi Taniguchi (author) (Search by this author)

https://orcid.org/0000-0002-1467-3105

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Takashi Taniguchi ;

Michel Orrit (author) (Search by this author)

Michel Orrit ;

Frank Koppens (author) (Search by this author)

Frank Koppens ;

Antoine Reserbat-Plantey (author) (Search by this author)

Antoine Reserbat-Plantey

Keyword

charge defects, graphene transistor
, Stark shift


Date published

2025-09-01

Updated at

2026-05-11 13:21:53 +0900