ジャーナル論文 Optical detection of charge defects near a graphene transistor using the Stark shift of fluorescent molecules
Carlotta Ciancico (author) (この著者で検索)
;
Iacopo Torre (author) (この著者で検索)
;
Bernat Terrés (author) (この著者で検索)
;
Alvaro Moreno (author) (この著者で検索)
;
Robert Smit (author) (この著者で検索)
;
Kenji Watanabe (author) (この著者で検索)
ORCID SAMURAI ;
Takashi Taniguchi (author) (この著者で検索)
ORCID SAMURAI ;
Michel Orrit (author) (この著者で検索)
;
Frank Koppens (author) (この著者で検索)
;
Antoine Reserbat-Plantey (author) (この著者で検索)
コレクション

引用
Carlotta Ciancico, Iacopo Torre, Bernat Terrés, Alvaro Moreno, Robert Smit, Kenji Watanabe, Takashi Taniguchi, Michel Orrit, Frank Koppens, Antoine Reserbat-Plantey. Optical detection of charge defects near a graphene transistor using the Stark shift of fluorescent molecules. APL Quantum. 2025, 2 (3), 036101. https://doi.org/10.1063/5.0274182

説明:

(abstract)

Two-dimensional crystals and their heterostructures unlock access to a class of photonic devices, bringing nanophotonics from the nanometer scale down to the atomic level where quantum effects are relevant. Single-photon emitters (SPEs) are central in quantum photonics as quantum markers linked to their electrostatic, thermal, magnetic, or dielectric environment. This aspect is exciting in two-dimensional (2D) crystals and their heterostructures, where the environment can be abruptly modified through vertical stacking or lateral structuring, such as moiré or nano-patterned gates. To further develop 2D-based quantum photonic devices, there is a need for quantum markers that are capable of integration into various device geometries, and that can be read out individually, non- destructively, and without additional electrodes. Here, we show how to optically detect charge carrier accumulation using sub-GHz linewidth single-photon emitters coupled to a graphene device. We employ the single molecule Stark effect, sensitive to the electric fields generated by charge puddles, such as those at the graphene edge. The same approach enables dynamic sensing of electronic noise, and we demonstrate the optical read-out of low-frequency white noise in a biased graphene device. The approach described here can be further exploited to explore charge dynamics in 2D heterostructures using quantum emitter markers.

権利情報:

キーワード: charge defects, graphene transistor
, Stark shift


刊行年月日: 2025-09-01

出版者: AIP Publishing

掲載誌:

  • APL Quantum vol. 2 issue. 3 p. 36101-36101 036101

研究助成金:

  • QuantERA 731473
  • Fundación Carmen y Severo Ochoa SEV-2015-0522
  • Agence Nationale de La Recherche
  • Air Force Office of Scientific Research FA8655-23-1-7047

原稿種別: 出版者版 (Version of record)

MDR DOI:

公開URL: https://doi.org/10.1063/5.0274182

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更新時刻: 2026-05-11 13:21:53 +0900

MDRでの公開時刻: 2026-05-11 16:25:06 +0900

ファイル名 サイズ
ファイル名 036101_1.pdf (サムネイル)
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サイズ 8MB 詳細