Analysis of local strain fields around individual threading dislocations in GaN substrates by nanobeam x-ray diffraction

Journal article

Creator

T. Hamachi (author) (Search by this author)

https://orcid.org/0000-0002-0631-1729 (unauthenticated)

T. Hamachi ;

T. Tohei (author) (Search by this author)

https://orcid.org/0000-0002-4113-2566 (unauthenticated)

T. Tohei ;

Y. Hayashi (author) (Search by this author)

https://orcid.org/0000-0001-5672-1497

NIMS Researchers Directory SAMURAI

Y. Hayashi ;

S. Usami (author) (Search by this author)

https://orcid.org/0000-0002-9710-1718 (unauthenticated)

S. Usami ;

M. Imanishi (author) (Search by this author)

M. Imanishi ;

Y. Mori (author) (Search by this author)

Y. Mori ;

K. Sumitani (author) (Search by this author)

K. Sumitani ;

Y. Imai (author) (Search by this author)

https://orcid.org/0000-0003-4686-2629 (unauthenticated)

Y. Imai ;

S. Kimura (author) (Search by this author)

https://orcid.org/0000-0003-1064-7572 (unauthenticated)

S. Kimura ;

A. Sakai (author) (Search by this author)

https://orcid.org/0000-0002-0654-504X (unauthenticated)

A. Sakai

Keyword

GaN, Dislocation, SPring-8

Date published

2024-06-14

Updated at

2024-12-05 12:47:52 +0900