Keyword: scanning transmission electron microscopy
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SciRep(2025)Kimoto.pdf
Nonnegative matrix factorization incorporating domain specific constraints for four dimensional scanning transmission electron microscopy
Journal article
Creator
ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI ;
Yuki Shibazaki (author) (Search by this author)
ORCID ; ORCID SAMURAI ; ORCID SAMURAI
Keyword
4D-STEM, unsupervised machine learning, nonnegative matrix factorization, scanning transmission electron microscopy, metallic glass, amorphous, ZrCuAl
Date published
2025-11-07
Updated at
2025-12-01 12:30:04 +0900
1-s2.0-S0968432825001064-main (final).pdf
Liquid-cell annular dark-field scanning transmission electron microscopy imaging of single crystal samples on a low-index zone-axis incidence condition
Journal article
Creator
Masaki Takeguchi (author) (Search by this author)
Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Environment-Controlled Microscopy Group, National Institute for Materials Science
ORCID SAMURAI ;
Jonathan Lueke (author) (Search by this author)
Norcada (Canada)
;
Matthew Reynolds (author) (Search by this author)
Norcada (Canada)
;
Baibing Zhao (author) (Search by this author)
KITANO SEIKI Ltd
;
Ayako Hashimoto (author) (Search by this author)
Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Environment-Controlled Microscopy Group, National Institute for Materials Science
ORCID SAMURAI
Keyword
liquid-cell, scanning transmission electron microscopy, zone-axis incidence, atomic resolution
Date published
2025-07-17
Updated at
2025-10-01 12:30:18 +0900
Acceptor activation of Mg-doped GaN – Effects of N2-O2 vs N2 as ambient gas during annealing.pdf
Acceptor activation of Mg-doped GaN—Effects of N2/O2 vs N2 as ambient gas during annealing
Journal article
Creator
Ashutosh Kumar (author) (Search by this author)
National Institute for Materials Science
ORCID ;
Martin Berg (author) (Search by this author)
;
Qin Wang (author) (Search by this author)
;
Jun Uzuhashi (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Tadakatsu Ohkubo (author) (Search by this author)
National Institute for Materials Science
ORCID SAMURAI ;
Michael Salter (author) (Search by this author)
;
Peter Ramvall (author) (Search by this author)
Keyword
gallium nitride, scanning transmission electron microscopy, semiconductor, activation
Date published
2023-07-21
Updated at
2024-01-05 22:12:15 +0900
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