4 records found.
Calculations of electron inelastic mean free paths. V. Data for 14 organic compounds over the 50–2000 eV range
- Journal article
- Creator
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Shigeo Tanuma (author) (Search by this author)National Institute for Materials Science
- Keyword
- IMFP, electron inelastic mean free path, TPP-2M, IMFP predictive formula, organic compounds, Penn algorithm
- Date published
- 2004-09-15
- Updated at
- 2023-05-16 10:30:30 +0900
Calculations of Electron Inelastic Mean Free Paths (IMFPs). XIV. Calculated IMFPs for LiF and Si3N4 and Development of an Improved Predictive IMFP Formula
- Journal article
- Creator
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;Jablonski, Aleksander (author) (Search by this author)Institute of Physical Chemistry, Polish Academy of SciencesTanuma, Shigeo (author) (Search by this author)技術開発・共用部門, National Institute for Materials Science
;
Powell, C. Cedric (author) (Search by this author)
https://orcid.org/0000-0001-8990-2286
(unauthenticated)
Associate, Materials Measurement Science Division, National Institute of Standards and Technology
- Keyword
- IMFP, electron inelastic mean free path, Improved Predictive IMFP Formula, JTP equation, TPP-2M
- Date published
- 2023-05-20
- Updated at
- 2024-01-05 22:13:23 +0900
Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range
- Journal article
- Creator
-
Tanuma, Shigeo (author) (Search by this author)
;
Powell, C. J. (author) (Search by this author)
https://orcid.org/0000-0001-8990-2286
(unauthenticated)
;
Penn, D. R. (author) (Search by this author)
- Keyword
- IMFP, TPP-2M, electron inelastic mean free paths, elemental solids
- Date published
- 2011-02-08
- Updated at
- 2024-01-05 22:14:03 +0900
Calculation of Electron Inelastic Mean Free Paths (IMFPs). VII. Reliability of the TPP-2M IMFP Predictive Equation
- Journal article
- Creator
-
Tanuma, Shigeo (author) (Search by this author)
;
Powell, C. J. (author) (Search by this author)
https://orcid.org/0000-0001-8990-2286
(unauthenticated)
;
Penn, D. R. (author) (Search by this author)
- Keyword
- IMFP, TPP-2M, number of valence electrons, elemental solids, XPS, electron inelastic mean free paths, surface sensitivity, IMFPs, AES, surface analysis
- Date published
- 2003-02-11
- Updated at
- 2022-10-03 01:54:38 +0900