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Exciton Self-Trapping in Twisted Hexagonal Boron Nitride homostructures

Journal article
Creator: Sébastien Roux (author) (Search by this author)

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Christophe Arnold (author) (Search by this author)

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Etienne Carré (author) (Search by this author)

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Alexandre Plaud (author) (Search by this author)

;

Lei Ren (author) (Search by this author)

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Frédéric Fossard (author) (Search by this author)

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Nicolas Horezan (author) (Search by this author)

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Eli Janzen (author) (Search by this author)

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James H. Edgar (author) (Search by this author)

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Camille Maestre (author) (Search by this author)

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Bérangère Toury (author) (Search by this author)

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Catherine Journet (author) (Search by this author)

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Vincent Garnier (author) (Search by this author)

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Philippe Steyer (author) (Search by this author)

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Takashi Taniguchi (author) (Search by this author)

https://orcid.org/0000-0002-1467-3105

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

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Kenji Watanabe (author) (Search by this author)

https://orcid.org/0000-0003-3701-8119

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

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Cédric Robert (author) (Search by this author)

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Xavier Marie (author) (Search by this author)

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François Ducastelle (author) (Search by this author)

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Annick Loiseau (author) (Search by this author)

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Julien Barjon (author) (Search by this author)
Keyword: exciton self-trapping , twisted hexagonal boron nitride (h-BN) , cathodoluminescence
Date published: 2025-05-27
Updated at: 2026-02-17 12:30:31 +0900

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Exciton Self-Trapping in Twisted Hexagonal Boron Nitride homostructures

Scanning electron irradiation of hexagonal boron nitride: an efficient procedure for quenching undesired defects emissions monitored by in-situ room temperature cathodoluminescence