- MDR phonon calculation database(10025)
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- Lattice thermal conductivity calculation datasets for 103 binary compounds by finite displacement method (PBE)(103)
- Lattice thermal conductivity calculation datasets for 103 binary compounds by finite displacement method(103)
- 無機材研ニュース(41)
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Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
-
OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
-
OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-01-05 22:12:25 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
-
OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-03-30 18:50:25 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
-
OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-04-07 22:57:41 +0900
Original dataset for ID 211 Ni-50at%Ti in Thermophysical Property Database
- Dataset
- Collection
- Thermophysical Property Original Datasets
- Creator
-
;Takehiko Ishikawa (depositor) (Search by this author)Japan Aerospace Exploration AgencyMasashi Ishii (editor) (Search by this author)National Institute for Materials Science
- Keyword
- Ni-50at%Ti, Alloy, Density, VELF, Electrostatic Levitation, collection - Thermophys Datasets
- Date published
- Updated at
- 2024-03-30 18:38:09 +0900
Original dataset for ID 173 Zr80O20 in Thermophysical Property Database
- Dataset
- Collection
- Thermophysical Property Original Datasets
- Creator
-
;Takehiko Ishikawa (depositor) (Search by this author)Japan Aerospace Exploration AgencyMasashi Ishii (editor) (Search by this author)National Institute for Materials Science
- Keyword
- Zr80O20, Ceramic, Density, VELF, Electrostatic Levitation, collection - Thermophys Datasets
- Date published
- Updated at
- 2024-03-30 18:38:11 +0900
XAFS spectrum of Cesium sulfate, anhydrous
- Dataset
- Collection
- MDR XAFS DB
- Creator
-
Masashi Ishii (editor) (Search by this author)National Institute for Materials Science
;
Industrial Application and Partnership Division (author) (Search by this author)Japan Synchrotron Radiation Research Institute
- Keyword
- collection - MDR XAFS DB, XAFS, SPring-8, BL14B2, Si(311), Cs2SO4, Cs K-edge, Sulfate, Cesium sulfate, anhydrous
- Date published
- 2021-07-23
- Updated at
- 2025-05-02 21:46:53 +0900
Original dataset for ID 155 Zr80O20 in Thermophysical Property Database
- Dataset
- Collection
- Thermophysical Property Original Datasets
- Creator
-
;Takehiko Ishikawa (depositor) (Search by this author)Japan Aerospace Exploration AgencyMasashi Ishii (editor) (Search by this author)National Institute for Materials Science
- Keyword
- Zr80O20, Ceramic, Density, VELF, Electrostatic Levitation, collection - Thermophys Datasets
- Date published
- Updated at
- 2024-03-30 18:38:04 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- Dataset
- Creator
-
OGIWARA, Toshiya (author) (Search by this author)National Institute for Materials Science
;
NAGATA, Takahiro (author) (Search by this author)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (Search by this author)National Institute for Materials Science
- Keyword
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- Date published
- 2019-03-07
- Updated at
- 2024-10-08 12:20:27 +0900
XAFS spectrum of Cesium iodide, anhydrous
- Dataset
- Collection
- MDR XAFS DB
- Creator
-
Masashi Ishii (editor) (Search by this author)National Institute for Materials Science
;
Industrial Application and Partnership Division (author) (Search by this author)Japan Synchrotron Radiation Research Institute
- Keyword
- collection - MDR XAFS DB, XAFS, SPring-8, BL14B2, Si(311), CsI, Cs K-edge, Iodide, Cesium iodide, anhydrous
- Date published
- 2021-07-24
- Updated at
- 2025-05-02 22:05:37 +0900