Analyses of oxygen precipitates in CZ-Si by X-ray diffuse scattering using parallel X-ray beam
- Journal article
- Creator
-
;Tomoyuki Horikawa (author) (Search by this author);Yoshiyuki Tsusaka (author) (Search by this author);Junji Matsui (author) (Search by this author);Tetsuya Tohei (author) (Search by this author)Yusuke Hayashi (author) (Search by this author)National Institute for Materials Science
;
Akira Sakai (author) (Search by this author) - Keyword
- Silicon, X-ray diffuse scattering
- Date published
- 2025-04-01
- Updated at
- 2026-02-14 21:58:00 +0900
XAFS spectrum of Silicon
- Dataset
- Collection
- MDR XAFS DB
- Creator
-
Masashi Ishii (editor) (Search by this author)National Institute for Materials Science
;
Ritsumeikan SR Center (author) (Search by this author)Ritsumeikan University
- Keyword
- Silicon (wafer), Si, Si K-edge, Pure metal, BL-10, Ritsumeikan-SR, XAFS, collection - MDR XAFS DB, Silicon, Pure metalloid
- Date published
- Updated at
- 2025-05-02 21:52:42 +0900
XAFS spectrum of Silicon
- Dataset
- Collection
- MDR XAFS DB
- Creator
-
Masashi Ishii (editor) (Search by this author)National Institute for Materials Science
;
Ritsumeikan SR Center (author) (Search by this author)Ritsumeikan University
- Keyword
- Silicon (powder), Si, Si K-edge, Pure metal, BL-10, Ritsumeikan-SR, XAFS, collection - MDR XAFS DB, Silicon, Pure metalloid
- Date published
- Updated at
- 2025-05-02 21:46:28 +0900
Low-Contrast BIC Metasurfaces with Quality Factors Exceeding 100,000
- Journal article
- Creator
-
Keisuke Watanabe (author) (Search by this author)National Institute for Materials Science
;
Tadaaki Nagao (author) (Search by this author)National Institute for Materials Science
;
Masanobu Iwanaga (author) (Search by this author)National Institute for Materials Science
- Keyword
- Metasurfaces, Bound states in the continuum, Q factors, All-dielectric, Silicon, Biosensors
- Date published
- 2025-02-19
- Updated at
- 2025-02-23 22:49:30 +0900
A model reasoning low-energy track-formation and enhanced nuclear energy loss in Si irradiated with C60 ions
- Journal article
- Creator
-
H. Amekura (author) (Search by this author)
;
K. Narumi (author) (Search by this author)
https://orcid.org/0000-0001-8569-0108
(unauthenticated)
;
;A. Chiba (author) (Search by this author);Y. Hirano (author) (Search by this author);K. Yamada (author) (Search by this author);S. Yamamoto (author) (Search by this author);Y. Saitoh (author) (Search by this author)H. Segawa (author) (Search by this author)
- Keyword
- ion track, C60 ion, Silicon, Synergy effect, Cluster effect
- Date published
- 2026-06-17
- Updated at
- 2026-06-18 14:50:54 +0900