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3385 records found.

10.1080_14686996.2020.1738268.pdf
Data-based selection of creep constitutive models for high-Cr heat-resistant steel
Article
Creator
Izuno, Hitoshi SAMURAI ORCID ; Demura, Masahiko SAMURAI ORCID ; Tabuchi, Masaaki SAMURAI ORCID ; Mototake, Yoh-ichi ; Okada, Masato
Keyword
theta method, Creep constitutive equation, model selection method, bayesian free energy, steady-state creep, grade 91 steel
Date published
2020-01-31
Updated at
2024-01-05 22:12:23 +0900
10.1038_s41598-020-65945-7.pdf
A universal Bayesian inference framework for complicated creep constitutive equations
Article
Creator
Izuno, Hitoshi SAMURAI ORCID ; Mototake, Yoh-ichi ; Nagata, Kenji SAMURAI ORCID ; Demura, Masahiko SAMURAI ORCID ; Okada, Masato
Keyword
Materials science, Metals and alloys, Structural materials
Date published
2020-06-26
Updated at
2024-01-05 22:13:52 +0900
JCP21-AR-COMMA2021-00971.pdf
Combination of recommender system and single-particle diagnosis for accelerated discovery of novel nitrides
Article
Creator
KOYAMA, Yukinori SAMURAI ORCID ; SEKO, Atsuto ORCID ; TANAKA, Isao ORCID ; FUNAHASHI, Shiro SAMURAI ORCID ; HIROSAKI, Naoto SAMURAI ORCID
Keyword
materials informatics, density functional theory calculation, materials search
Date published
2021-06-14
Updated at
2024-01-05 22:12:06 +0900
JSA_Vol18_No3_174.pdf
High-Sensitivity and High-Depth Resolution Auger Depth Profiling Using an Inclined Holder based on Geometric Characteristics of Auger Electron Spectroscopy Apparatus Equipped with Concentric Hemispherical Analyzer
Article
Creator
Tanuma, Shigeo SAMURAI ORCID ; Ogiwara, Toshiya SAMURAI ORCID ; Kim, Kyung Joong ORCID ; Nagatomi, Takaharu ORCID
Keyword
Auger Depth Profiling Analysis, Si/Ge multiple delta-doped layers, GaAs/AlAs Superlattice, Inclined Holder
Date published
2016-04-03
Updated at
2024-01-05 22:13:47 +0900
JSA_Vol25_14-20.pdf
Auger Depth Profiling Analysis of FeNi/CoFeB/FeNi Specimen Using an Ultra Low Angle Incidence Ion Beam
Article
Creator
Ogiwara, Toshiya SAMURAI ORCID ; Yanagiuchi, Katsuaki ORCID ; Yoshikawa, Hideki SAMURAI ORCID
Keyword
Auger Depth Profiling Analysis, FeNi/CoFeB/FeNi Thin Film , Ultra Low Angle Incidence Ion Beam
Date published
2019-03-31
Updated at
2024-01-05 22:13:23 +0900
JSA_Vol.1_No.1_36-42.pdf
Arイオンスパッタリングされた各種化合物半導体表面のSEM観察
Article
Creator
Ogiwara, Toshiya SAMURAI ORCID ; Tanuma, Shigeo SAMURAI ORCID
Keyword
argon ion sputtering, compound semiconductor, surface observation using a scanning electron microscope
Date published
1995-03-08
Updated at
2022-10-03 01:31:38 +0900
JSA_Vol.1_No.2_227-233.pdf
InP/GaInAsP多層膜におけるAES深さ分解能の温度依存性
Article
Creator
Ogiwara, Toshiya SAMURAI ORCID ; Tanuma, Shigeo SAMURAI ORCID
Keyword
Auger Depth Profiling Analysis, Depth Resolution, Sample Temperature, InP/GaInAsP多層膜
Date published
1995-05-17
Updated at
2022-10-03 01:44:22 +0900
Vol.24_No.3_03_Ogiwara.pdf
Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam
Article
Creator
Yoshikawa, Hideki SAMURAI ORCID ; Ogiwara, Toshiya SAMURAI ORCID ; Nagata, Takahiro SAMURAI ORCID
Keyword
Auger Depth Profiling analysis, HfO2/Si, Ultra Low Angle Incidence Ion Beam
Date published
2019-03-07
Updated at
2024-01-05 22:11:28 +0900
IMFP_X_Author_V.pdf
Calculations of electron inelastic mean free paths. X. Data for 41 elemental solids over the 50 eV to 200 keV range with the relativistic full Penn algorithm
Article
Creator
Shinotsuka, Hiroshi SAMURAI ORCID ; TANUMA, Shigeo SAMURAI ORCID ; Powell, Cedric J. ORCID ; Penn, David R.
Keyword
TPP-2M, 14 ~ IMFP, 13 ~ Fano plot, 10 ~ predictive equation for IMFP, 12 ~ relativistic Bethe equation, ELF, 11 ~ elemental solid, relativistic full Penn algorithm, energy loss function, electron inelastic mean free path, full Penn algorithm, inelastic mean free paths, FPA, optical constant, relativistic TPP-2M
Date published
2015-07-23
Updated at
2024-01-05 22:14:05 +0900
Movie1.mp4
Free Analysis and Visualization Programs for Electrochemical Impedance Spectroscopy Coded in Python
Article
Creator
KOBAYASHI, Kiyoshi SAMURAI ORCID ; SUZUKI, Tohru S.
Keyword
model fitting, free software, electrochemical impedance, data visualization
Date published
2021-03-05
Updated at
2024-01-05 22:11:18 +0900