2 件のレコードが見つかりました。
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM
- 論文
- 著者
-
Jun Uzuhashi
;
Yuanzhao Yao
;
Tadakatsu Ohkubo
;
Takashi Sekiguchi
- キーワード
- transmission electron microscopy, scanning electron microscopy, focused ion beam
- 刊行年月日
- 2025-08-01
- 更新時刻
- 2026-01-31 16:30:04 +0900
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
- 論文
- 著者
-
Jun Uzuhashi
;
Tadakatsu Ohkubo
;
Kazuhiro Hono
- キーワード
- atom probe tomography, focused ion beam, scanning electron microscopy
- 刊行年月日
- 2025-02-03
- 更新時刻
- 2024-09-05 08:30:18 +0900