Quantitative characterization of built-in potential profile across GaAs p–n junctions using Kelvin probe force microscopy with qPlus sensor AFM

論文

著者

Nobuyuki Ishida ; Takaaki Mano

キーワード

GaAs(110), Kelvin probe force microscopy, p-n junction, qPlus sensor

刊行年月日

2024-02-05

更新時刻

2024-04-04 08:30:11 +0900