Characterization of δNi₂Si Precipitates in Cu-Ni-Si Alloy by Small-Angle X-ray Scattering, Small-Angle Neutron Scattering, and Atom Probe Tomography

ジャーナル論文

著者

Hirokazu Sasaki (author) (この著者で検索)

Hirokazu Sasaki ;

Syunta Akiya (author) (この著者で検索)

Syunta Akiya ;

Kuniteru Mihara (author) (この著者で検索)

Kuniteru Mihara ;

Yojiro Oba (author) (この著者で検索)

Yojiro Oba ;

Masato Onuma (author) (この著者で検索)

Masato Onuma ;

Jun Uzuhashi (author) (この著者で検索)

https://orcid.org/0000-0003-2023-8158

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Jun Uzuhashi ;

Tadakatsu Ohkubo (author) (この著者で検索)

https://orcid.org/0000-0003-3548-1951

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Tadakatsu Ohkubo

キーワード

atom probe tomography

刊行年月日

2025-01-01

更新時刻

2025-01-08 16:31:18 +0900