Vacancy‐Type Defects and Their Trapping/Detrapping of Charge Carriers in Ion‐Implanted GaN Studied by Positron Annihilation

ジャーナル論文

著者

Akira Uedono (author) (この著者で検索)

https://orcid.org/0000-0001-6224-4869 (unauthenticated)

Akira Uedono ;

Ryo Tanaka (author) (この著者で検索)

https://orcid.org/0000-0002-4058-7649 (unauthenticated)

Ryo Tanaka ;

Shinya Takashima (author) (この著者で検索)

https://orcid.org/0000-0002-3212-4521 (unauthenticated)

Shinya Takashima ;

Katsunori Ueno (author) (この著者で検索)

Katsunori Ueno ;

Masaharu Edo (author) (この著者で検索)

Masaharu Edo ;

Kohei Shima (author) (この著者で検索)

https://orcid.org/0000-0003-0967-141X (unauthenticated)

Kohei Shima ;

Shigefusa F. Chichibu (author) (この著者で検索)

https://orcid.org/0000-0001-9558-1642 (unauthenticated)

Shigefusa F. Chichibu ;

Jun Uzuhashi (author) (この著者で検索)

https://orcid.org/0000-0003-2023-8158

NIMS Researchers Directory SAMURAI

Jun Uzuhashi ;

Tadakatsu Ohkubo (author) (この著者で検索)

https://orcid.org/0000-0003-3548-1951

NIMS Researchers Directory SAMURAI

Tadakatsu Ohkubo ;

Shoji Ishibashi (author) (この著者で検索)

https://orcid.org/0000-0002-4896-3530 (unauthenticated)

Shoji Ishibashi ;

Kacper Sierakowski (author) (この著者で検索)

https://orcid.org/0000-0002-9447-1182 (unauthenticated)

Kacper Sierakowski ;

Michal Bockowski (author) (この著者で検索)

https://orcid.org/0000-0003-1616-685X (unauthenticated)

Michal Bockowski

キーワード

gallium nitride

刊行年月日

2024-02-29

更新時刻

2025-03-01 12:30:45 +0900