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1068 件のレコードが見つかりました。
: A triclinically distorted double perovskite with low-dimensional magnetic behavior
- ジャーナル論文
- 著者
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Xuan Liang (author) (この著者で検索)National Institute for Materials Science
;
Kazunari Yamaura (author) (この著者で検索)National Institute for Materials Science
;
;Alexander A. Tsirlin (author) (この著者で検索)Alexei A. Belik (author) (この著者で検索)National Institute for Materials Science
- キーワード
- double perovskites, magnetic properties, synchrotron diffraction, low-dimensional magnetism, first-principles calculations
- 刊行年月日
- 2025-03-24
- 更新時刻
- 2025-11-08 08:30:15 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:25 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:11:29 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Guinier-Preston (GP) zone strengthening of dilute magnesium alloys comprised of earth-abundant elements
- ジャーナル論文
- 著者
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;Jishnu J. Bhattacharyya (author) (この著者で検索);Seth Faberman (author) (この著者で検索);Zehao Li (author) (この著者で検索)National Institute for Materials Science;Aaron Sullivan (author) (この著者で検索);Du Cheng (author) (この著者で検索);Bassel Khoury (author) (この著者で検索);Yuanchen Gao (author) (この著者で検索)Taisuke Sasaki (author) (この著者で検索)National Institute for Materials Science
;
;Bicheng Zhou (author) (この著者で検索);Derek Warner (author) (この著者で検索)Sean R. Agnew (author) (この著者で検索)
- キーワード
- strength modeling, age-hardening, crystal plasticity, G.P. zone, magnesium alloys
- 刊行年月日
- 2024-12-21
- 更新時刻
- 2025-04-08 13:16:02 +0900
Statistical approach based on the Stoner-Wohlfarth model for the switching field in a misoriented magnet array
- ジャーナル論文
- 著者
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Donghyeon Lee (author) (この著者で検索)
https://orcid.org/0000-0002-3796-1919
(unauthenticated)
;
;Jungmin Park (author) (この著者で検索);Donghyeon Han (author) (この著者で検索);Suzuki Ippei (author) (この著者で検索)Takahashi Yukiko (author) (この著者で検索)
;
;Sujung Noh (author) (この著者で検索);Jisung Lee (author) (この著者で検索);JoonHyun Kwon (author) (この著者で検索);Hansaem Lee (author) (この著者で検索)Sanghoon Kim (author) (この著者で検索)
https://orcid.org/0000-0002-4577-8866
(unauthenticated)
- キーワード
- Magnetizaition switching, FePt granular film
- 刊行年月日
- 2024-02-13
- 更新時刻
- 2024-02-22 08:30:07 +0900