License: In Copyright Keyword: scanning electron microscopy
Reset all filters

2 records found.

Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled STEM lamella preparation via FIB-SEM.pdf
Experimental investigation and simulation of SEM image intensity behaviors for developing thickness-controlled S/TEM lamella preparation via FIB-SEM
Article
Creator
Jun Uzuhashi SAMURAI ORCID ; Yuanzhao Yao ; Tadakatsu Ohkubo SAMURAI ORCID ; Takashi Sekiguchi
Keyword
transmission electron microscopy, scanning electron microscopy, focused ion beam
Date published
2025-08-01
Updated at
2026-01-31 16:30:04 +0900
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam-Scanning Electron Microscopy.pdf
An Automated Site-Specific Tip Preparation Method for Atom Probe Tomography Using Script-Controlled Focused Ion Beam/Scanning Electron Microscopy
Article
Creator
Jun Uzuhashi SAMURAI ORCID ; Tadakatsu Ohkubo SAMURAI ORCID ; Kazuhiro Hono SAMURAI ORCID
Keyword
atom probe tomography, focused ion beam, scanning electron microscopy
Date published
2025-02-03
Updated at
2024-09-05 08:30:18 +0900