メニュー
MDRについて
ヘルプ
お問い合わせ
Switch language
日本語
English
ログイン
ログイン
Search MDR
Home
論文・データセット
コレクション
SuperCon Knowledge Collection(2)
PoLyInfo Knowledge Collection(1)
資源タイプ
データセット(12)
ジャーナル論文(8)
キーワード
Auger depth profiling analysis (8)
HfO2/Si (8)
Ultra low angle incidence ion beam (8)
Ontology (2)
RDF (2)
SPARQL (2)
Semantic Web (2)
SuperCon (2)
Superconductors (2)
CFRP (1)
(more)
ライセンス
In Copyright (9)
Creative Commons BY Attribution 4.0 International (8)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (2)
ファイル種別
application/zip (20)
application/pdf (15)
text/plain (2)
ファイル種別: application/zip
全ての絞り込みを解除
20 件のレコードが見つかりました。 1件目から10件目まで表示します。
全ての絞り込みを解除
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:11:29 +0900
Pulsed laser deposition of ZnO/MgxZn1-xO superlattices for quantum cascade laser applications
ジャーナル論文
著者
Tatsuya Masuda
(author) (
この著者で検索
)
a Smart Combinatorial Technology
Tatsuya Masuda
;
Toshihiro Sato
(author) (
この著者で検索
)
Toshihiro Sato
;
Norihiko Sekine
(author) (
この著者で検索
)
Norihiko Sekine
;
Iwao Hosako
(author) (
この著者で検索
)
Iwao Hosako
;
Gen-Ichi Hatakoshi
(author) (
この著者で検索
)
Gen-Ichi Hatakoshi
;
Hideomi Koinuma
(author) (
この著者で検索
)
Hideomi Koinuma
;
Ryota Takahashi
(author) (
この著者で検索
)
Ryota Takahashi
キーワード
Pulsed laser deposition
,
quantum cascade laser
,
ZnO/MgxZn1-xO superlattices
刊行年月日
2026-07-16
更新時刻
2026-07-17 14:49:14 +0900
Research Data Express: a data accumulation and sharing system for digital transformation in materials research
ジャーナル論文
著者
Jun Fujima
(author) (
この著者で検索
)
https://orcid.org/0000-0002-0858-8035
National Institute for Materials Science Research Network and Facility Services Division/Materials Data Platform/Data Application Unit
NIMS Researchers Directory SAMURAI
Jun Fujima
;
Hideki Yoshikawa
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science Research Network and Facility Services Division/Materials Data Platform/Data Application Unit
NIMS Researchers Directory SAMURAI
Hideki Yoshikawa
;
Hiroko Nagao
(author) (
この著者で検索
)
National Institute for Materials Science Research Network and Facility Services Division/Materials Data Platform/Data Application Unit
Hiroko Nagao
;
Hiroaki Tosaka
(author) (
この著者で検索
)
National Institute for Materials Science Research Network and Facility Services Division/Materials Data Platform/Data Infrastructure Unit
Hiroaki Tosaka
;
Takuya Kadohira
(author) (
この著者で検索
)
https://orcid.org/0000-0003-0569-1309
National Institute for Materials Science Research Network and Facility Services Division/Materials Data Platform/Data Infrastructure Unit
NIMS Researchers Directory SAMURAI
Takuya Kadohira
;
Masahiko Demura
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7308-3041
National Institute for Materials Science Research Network and Facility Services Division
NIMS Researchers Directory SAMURAI
Masahiko Demura
キーワード
materials informatics
,
data management system
,
digital transformation (DX)
,
dataset Template
,
workflow automation
刊行年月日
2025-12-31
更新時刻
2025-12-19 16:30:40 +0900
キーワード
Auger depth profiling analysis
(8)
HfO2/Si
(8)
Ultra low angle incidence ion beam
(8)
Ontology
(2)
RDF
(2)
SPARQL
(2)
Semantic Web
(2)
SuperCon
(2)
Superconductors
(2)
CFRP
(1)
Charge Density Wave (CDW)
(1)
Chiral π‑conjugated polymer
(1)
Composite
(1)
Conceptual schema
(1)
Debye model
(1)
Electron Correlations
(1)
First-principles calculation
(1)
Halide perovskite
(1)
Non-noble metal
(1)
PoLyInfo
(1)
Polymer chemistry knowledge
(1)
Pulsed laser deposition
(1)
Quantum Spin Hall (QSH) Insulator
(1)
ShEx
(1)
Sommerfeld model
(1)
TDA
(1)
X-ray CT
(1)
ZnO/MgxZn1-xO superlattices
(1)
anode
(1)
bio-composite
(1)
catalyst poisoning
(1)
circular dichroism
(1)
circularly polarized luminescence
(1)
collection - PoLyInfo Knowledge
(1)
crack, persistent homology
(1)
data management system
(1)
dataset Template
(1)
digital transformation (DX)
(1)
eringi
(1)
fiber positions
(1)
high entropy alloy
(1)
hydrogel
(1)
kanpyo
(1)
light emitting diode
(1)
materials informatics
(1)
oxidation reaction
(1)
oxygen evolution reaction
(1)
pulsed laser deposition
(1)
quantum cascade laser
(1)
quasi-harmonic vibrational contribution
(1)
reinforcement
(1)
thienopyrroledione
(1)
time resolved microwave conductivity
(1)
time resolved photoluminescence
(1)
titanium alloys
(1)
workflow automation
(1)
RDEメタデータ定義
RDE送り状
<
1
2
>
絞り込み
コレクション
SuperCon Knowledge Collection(2)
PoLyInfo Knowledge Collection(1)
資源タイプ
データセット(12)
ジャーナル論文(8)
キーワード
Auger depth profiling analysis (8)
HfO2/Si (8)
Ultra low angle incidence ion beam (8)
Ontology (2)
RDF (2)
SPARQL (2)
Semantic Web (2)
SuperCon (2)
Superconductors (2)
CFRP (1)
(more)
ライセンス
In Copyright (9)
Creative Commons BY Attribution 4.0 International (8)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (2)
ファイル種別
application/zip (20)
application/pdf (15)
text/plain (2)