Thermoelectric, magnetotransport, and ultrafast dynamics of bismuth telluride thin films grown using pulsed laser deposition: Effects of substrate temperature and post-annealing
- ジャーナル論文
- 著者
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;Le Thi Cam Tuyen (author) (この著者で検索)Chang Gung University a Division of Natural Science, Center for Education;Bih-Show Lou (author) (この著者で検索);Jyh-Wei Lee (author) (この著者で検索);Ngo Ngoc Uyen (author) (この著者で検索);Phuoc Huu Le (author) (この著者で検索);Chien-Neng Liao (author) (この著者で検索);Chih-Wei Luo (author) (この著者で検索)Jiunn-Yuan Lin (author) (この著者で検索)
- キーワード
- Bi2Te3, pulsed laser deposition, thermoelectrics, magnetotransport, pump-probe
- 刊行年月日
- 2026-12-31
- 更新時刻
- 2026-03-24 13:08:14 +0900
Multi-objective optimization for designing structurally similar proteins with dissimilar sequences
- ジャーナル論文
- 著者
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;Ryo Akiba (author) (この著者で検索)Institute of Science Tokyo a School of Life Science and Technology;Yoshitaka Moriwaki (author) (この著者で検索);Ryuichiro Ishitani (author) (この著者で検索)Naruki Yoshikawa (author) (この著者で検索)
- キーワード
- Protein design, multi-objective optimization, generative AI
- 刊行年月日
- 2026-12-31
- 更新時刻
- 2026-02-03 15:05:41 +0900
Dynamical visualization of attractively interacting single vortices in type-II/1 superconducting Nb by magneto-optical imaging
- データセット
- 著者
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S. Ooi (author) (この著者で検索)National Institute for Materials Science International Center for Materials Nanoarchitectonics
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M. Tachiki (author) (この著者で検索)National Institute for Materials Science International Center for Materials Nanoarchitectonics
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T. Mochiku (author) (この著者で検索)National Institute for Materials Science International Center for Materials Nanoarchitectonics
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;H. Ito (author) (この著者で検索)High Energy Accelerator Research Organization;T. Kubo (author) (この著者で検索)High Energy Accelerator Research OrganizationA. Kikuchi (author) (この著者で検索)National Institute for Materials Science Research Center for Energy and Environmental Materials (GREEN)
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S. Arisawa (author) (この著者で検索)National Institute for Materials Science
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K. Umemori (author) (この著者で検索)High Energy Accelerator Research Organization - キーワード
- vortex, superconductivity, niobium, type-II/1 superconductor, magneto-optical imaging
- 刊行年月日
- 更新時刻
- 2025-03-31 16:40:34 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
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NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:25 +0900