ファイル種別: application/zip
全ての絞り込みを解除

16 件のレコードが見つかりました。 1件目から10件目まで表示します。

全ての絞り込みを解除
ジャーナル論文
Dual quantum spin Hall insulator by density-tuned correlations in TaIrTe4
ジャーナル論文
著者
Jian Tang (author) (この著者で検索)
;
Thomas Siyuan Ding (author) (この著者で検索)
;
Hongyu Chen (author) (この著者で検索)
;
Anyuan Gao (author) (この著者で検索)
;
Tiema Qian (author) (この著者で検索)
;
Zumeng Huang (author) (この著者で検索)
;
Zhe Sun (author) (この著者で検索)
;
Xin Han (author) (この著者で検索)
;
Alex Strasser (author) (この著者で検索)
;
Jiangxu Li (author) (この著者で検索)
;
Michael Geiwitz (author) (この著者で検索)
;
Mohamed Shehabeldin (author) (この著者で検索)
;
Vsevolod Belosevich (author) (この著者で検索)
;
Zihan Wang (author) (この著者で検索)
;
Yiping Wang (author) (この著者で検索)
;
Kenji Watanabe (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
Takashi Taniguchi (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
David C. Bell (author) (この著者で検索)
;
Ziqiang Wang (author) (この著者で検索)
;
Liang Fu (author) (この著者で検索)
;
Yang Zhang (author) (この著者で検索)
;
Xiaofeng Qian (author) (この著者で検索)
;
Kenneth S. Burch (author) (この著者で検索)
;
Youguo Shi (author) (この著者で検索)
;
Ni Ni (author) (この著者で検索)
;
Guoqing Chang (author) (この著者で検索)
;
Su-Yang Xu (author) (この著者で検索)
;
Qiong Ma (author) (この著者で検索)
キーワード
Quantum Spin Hall (QSH) Insulator, Electron Correlations, Charge Density Wave (CDW)
刊行年月日
2024-04-18
更新時刻
2025-09-05 16:30:37 +0900
_最終稿版_機械学習による光電子収量分光PYSスペクトルの自動閾値予測200629.pdf
Automatic Threshold Prediction of Photoelectron Yield Spectroscopy (PYS) by Machine Learning
ジャーナル論文
著者
ORCID SAMURAI ;
YOSHITAKE, Michiko (author) (この著者で検索)
; ORCID SAMURAI ; ORCID SAMURAI
キーワード
threshold, machine learning, photoelectron yield spectroscopy
刊行年月日
2020-06-10
更新時刻
2024-01-05 22:12:44 +0900
Reproducible chiroptical activity from aggregated chiral thienopyrroledione fluorene conjugated polymers.pdf
Reproducible Chiroptical Activity from Aggregated Chiral Thienopyrroledione–Fluorene π‑Conjugated Polymers.
ジャーナル論文
著者
Nao Suzuki (author) (この著者で検索)
University of Tsukuba a Institute of Pure and Applied Sciences
;
Ziwei Hu (author) (この著者で検索)
;
Sota Nakayama (author) (この著者で検索)
;
Soh Kushida (author) (この著者で検索)
;
Yohei Yamamoto (author) (この著者で検索)
;
Wijak Yospanya (author) (この著者で検索)
;
Reiko Oda (author) (この著者で検索)
;
Takaki Kanbara (author) (この著者で検索)
;
Junpei Kuwabara (author) (この著者で検索)
キーワード
Chiral π‑conjugated polymer, thienopyrroledione, circular dichroism, circularly polarized luminescence
刊行年月日
2026-06-02
更新時刻
2026-06-19 13:05:19 +0900
Dataset
MaterialBERT for Natural Language Processing of Materials Science Texts
ジャーナル論文
著者
KAWANO, Hiroyuki (author) (この著者で検索)
Ridgelinez Limited
;
SATO, Fumitaka (author) (この著者で検索)
Ridgelinez Limited
;
YOSHITAKE, Michiko (author) (この著者で検索)
National Institute for Materials Science MaDIS
ORCID SAMURAI ;
MOTEKI, Fuma (operator) (この著者で検索)
Ridgelinez Limited
;
TERAOKA, Hiroshi (author) (この著者で検索)
Ridgelinez Limited
キーワード
word embedding, pre-training, BERT, literal information
刊行年月日
更新時刻
2025-04-15 08:30:11 +0900
Phonon anomaly and local distortion in iron-manganese-based Elinvar alloys.pdf
Phonon Anomaly and Local Distortion in Iron-Manganese-Based Elinvar Alloys
ジャーナル論文
著者
Yoshihiko Umemoto (author) (この著者で検索)
Tohoku University Institute for Materials Research
;
Yoichi Ikeda (author) (この著者で検索)
;
Takashi Honda (author) (この著者で検索)
;
Daisuke Ishikawa (author) (この著者で検索)
;
John A. Schneeloch (author) (この著者で検索)
;
Jörg C. Neuefeind (author) (この著者で検索)
;
Shinichiro Tozawa (author) (この著者で検索)
;
Rie Umetsu (author) (この著者で検索)
;
Despina Louca (author) (この著者で検索)
;
Alfred Q.R. Baron (author) (この著者で検索)
;
Masaki Fujita (author) (この著者で検索)
キーワード
Iron-manganese based alloy, Elinvar, martensitic transformation, phonon softening, local distortion
刊行年月日
2025-12-31
更新時刻
2025-08-06 08:30:28 +0900
HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
絞り込み