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Auger depth profiling analysis (8)
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43 件のレコードが見つかりました。 1件目から10件目まで表示します。
全ての絞り込みを解除
Inhomogeneity-driven multiform Spontaneous Hall Effect in conventional and unconventional superconductors
ジャーナル論文
著者
Nadia Stegani
(author) (
この著者で検索
)
a University of Genoa
Nadia Stegani
;
Ilaria Pallecchi
(author) (
この著者で検索
)
Ilaria Pallecchi
;
Nicola Manca
(author) (
この著者で検索
)
Nicola Manca
;
Martina Meinero
(author) (
この著者で検索
)
Martina Meinero
;
Michela Iebole
(author) (
この著者で検索
)
Michela Iebole
;
Matteo Cialone
(author) (
この著者で検索
)
Matteo Cialone
;
Valeria Braccini
(author) (
この著者で検索
)
Valeria Braccini
;
Koushik Karmakar
(author) (
この著者で検索
)
Koushik Karmakar
;
Andrey Maljuk
(author) (
この著者で検索
)
Andrey Maljuk
;
Bernd Büchner
(author) (
この著者で検索
)
Bernd Büchner
;
Vadim Grinenko
(author) (
この著者で検索
)
Vadim Grinenko
;
Marina Putti
(author) (
この著者で検索
)
Marina Putti
;
Federico Caglieris
(author) (
この著者で検索
)
Federico Caglieris
キーワード
Inhomogeneities
,
superconductors
,
spontaneous hall effect
,
simulations
刊行年月日
2025-12-31
更新時刻
2025-08-22 16:30:24 +0900
Thermoelectric, magnetotransport, and ultrafast dynamics of bismuth telluride thin films grown using pulsed laser deposition: Effects of substrate temperature and post-annealing
ジャーナル論文
著者
Le Thi Cam Tuyen
(author) (
この著者で検索
)
Chang Gung University a Division of Natural Science, Center for Education
Le Thi Cam Tuyen
;
Bih-Show Lou
(author) (
この著者で検索
)
Bih-Show Lou
;
Jyh-Wei Lee
(author) (
この著者で検索
)
Jyh-Wei Lee
;
Ngo Ngoc Uyen
(author) (
この著者で検索
)
Ngo Ngoc Uyen
;
Phuoc Huu Le
(author) (
この著者で検索
)
Phuoc Huu Le
;
Chien-Neng Liao
(author) (
この著者で検索
)
Chien-Neng Liao
;
Chih-Wei Luo
(author) (
この著者で検索
)
Chih-Wei Luo
;
Jiunn-Yuan Lin
(author) (
この著者で検索
)
Jiunn-Yuan Lin
キーワード
Bi2Te3
,
pulsed laser deposition
,
thermoelectrics
,
magnetotransport
,
pump-probe
刊行年月日
2026-12-31
更新時刻
2026-03-24 13:08:14 +0900
Anti-freezing supercapacitors using novel choline phosphate aqueous electrolytes
ジャーナル論文
著者
Jan Malczak
(author) (
この著者で検索
)
Poznań University of Technology a Faculty of Chemical Technology
Jan Malczak
;
Seyed Amirhossein Sanei
(author) (
この著者で検索
)
Seyed Amirhossein Sanei
;
Agnieszka Marcinkowska
(author) (
この著者で検索
)
Agnieszka Marcinkowska
;
Piotr Gajewski
(author) (
この著者で検索
)
Piotr Gajewski
;
Qamar Abbas
(author) (
この著者で検索
)
Qamar Abbas
キーワード
Choline phosphate
,
Anti-freezing electrolyte
,
carbon electrode
,
electric double-layer
,
Supercapacitor
刊行年月日
2026-06-19
更新時刻
2026-06-24 11:55:20 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900
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Auger depth profiling analysis
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コレクション
MDR XAFS DB(1)
資源タイプ
ジャーナル論文(30)
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その他(1)
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Auger depth profiling analysis (8)
HfO2/Si (8)
Ultra low angle incidence ion beam (8)
Thermoelectric (2)
pulsed laser deposition (2)
2D materials (1)
3D convolutional autoencoder (1)
AHE (1)
Anti-freezing electrolyte (1)
Aqueous organic redox flow batteries (1)
(more)
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