Pulsed laser deposition of ZnO/MgxZn1-xO superlattices for quantum cascade laser applications
- ジャーナル論文
- 著者
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;Tatsuya Masuda (author) (この著者で検索)a Smart Combinatorial Technology;Toshihiro Sato (author) (この著者で検索);Norihiko Sekine (author) (この著者で検索);Iwao Hosako (author) (この著者で検索);Gen-Ichi Hatakoshi (author) (この著者で検索);Hideomi Koinuma (author) (この著者で検索)Ryota Takahashi (author) (この著者で検索)
- キーワード
- Pulsed laser deposition, quantum cascade laser, ZnO/MgxZn1-xO superlattices
- 刊行年月日
- 2026-07-16
- 更新時刻
- 2026-07-17 14:49:14 +0900
Reproducible Chiroptical Activity from Aggregated Chiral Thienopyrroledione–Fluorene π‑Conjugated Polymers.
- ジャーナル論文
- 著者
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;Nao Suzuki (author) (この著者で検索)University of Tsukuba a Institute of Pure and Applied Sciences;Ziwei Hu (author) (この著者で検索);Sota Nakayama (author) (この著者で検索);Soh Kushida (author) (この著者で検索);Yohei Yamamoto (author) (この著者で検索);Wijak Yospanya (author) (この著者で検索);Reiko Oda (author) (この著者で検索);Takaki Kanbara (author) (この著者で検索)Junpei Kuwabara (author) (この著者で検索)
- キーワード
- Chiral π‑conjugated polymer, thienopyrroledione, circular dichroism, circularly polarized luminescence
- 刊行年月日
- 2026-06-02
- 更新時刻
- 2026-06-19 13:05:19 +0900
Estimation of valence state and growth rate using principal component analysis of plasma emission in reactive sputtering deposition
- ジャーナル論文
- 著者
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;Rintaro Minami (author) (この著者で検索)University of Tsukuba a Department of Applied Physics;Eiji Kita (author) (この著者で検索);Chiharu Mitsumata (author) (この著者で検索)Hideto Yanagihara (author) (この著者で検索)
- キーワード
- Machine learning, principal component analysis (PCA), reactive magnetron sputtering, plasma emission spectrum, Mössbauer spectroscopy
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2025-09-10 16:30:38 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:25 +0900