Surface-Structure Search with Variable Composition and Periodicity via Machine Learning and Evolutionary Algorithms: Applications to Pt/Ge Oxidation and Au--Sn Alloying
- ジャーナル論文
- 著者
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;F. Kuroda (author) (この著者で検索)National Institute of Advanced Industrial Science and Technology (AIST) a Materials DX Research CenterM. Otani (author) (この著者で検索)
- キーワード
- Sections, lists, figures, tables, mathematics, fonts, references, appendices
- 刊行年月日
- 2026-07-07
- 更新時刻
- 2026-07-08 16:54:06 +0900
Fluorinated Glycidyl Triazolyl Polymers Exhibiting Thermally Stable Layered Structures and Sticky Hydrophobic Surfaces
- ジャーナル論文
- 著者
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Taichi Ikeda (author) (この著者で検索)
;
Masafumi Yoshio (author) (この著者で検索)
- キーワード
- Fluorinated polymers, Liquid-crystal polymers, Post-polymerization functionalization, Click chemistry, Contact angle hysteresis, Sticky hydrophobic surface
- 刊行年月日
- 2026-02-27
- 更新時刻
- 2026-03-13 08:30:08 +0900
Catalyst poisoning influences from various functional groups of energy carriers towards electrochemical oxidation reactions on non-noble high entropy alloy anodes in acidic media
- ジャーナル論文
- 著者
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;Rafat Tahawy (author) (この著者で検索)University of Tsukuba a Department of Applied Physics, Institute of Pure and Applied Sciences;Salma Aridha Muflihah (author) (この著者で検索);Kosuke Hara (author) (この著者で検索);Tatsuhiko Ohto (author) (この著者で検索);Hisanori Tanimoto (author) (この著者で検索);Tianshu Li (author) (この著者で検索);Mahmoud Abdelnabi (author) (この著者で検索);Samuel Jeong (author) (この著者で検索);Tomohiko Nishiuchi (author) (この著者で検索);Hajime Kimizuka (author) (この著者で検索);Akfiny Hasdi Aimon (author) (この著者で検索)Yoshikazu Ito (author) (この著者で検索)
- キーワード
- Non-noble metal, high entropy alloy, oxygen evolution reaction, oxidation reaction, anode, catalyst poisoning
- 刊行年月日
- 2026-04-24
- 更新時刻
- 2026-04-27 13:14:06 +0900
Examples of SQS (special quasirandom structure) models for arbitrary binary bcc (body centered cubic) and hcp (hexagonal close packed) structures
- データセット
- 著者
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SAHARA, Ryoji (author) (この著者で検索)
- キーワード
- Sommerfeld model, quasi-harmonic vibrational contribution, First-principles calculation, Debye model, titanium alloys
- 刊行年月日
- 2020-10-15
- 更新時刻
- 2024-01-05 22:12:16 +0900
Inhomogeneity-driven multiform Spontaneous Hall Effect in conventional and unconventional superconductors
- ジャーナル論文
- 著者
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;Nadia Stegani (author) (この著者で検索)a University of Genoa;Ilaria Pallecchi (author) (この著者で検索);Nicola Manca (author) (この著者で検索);Martina Meinero (author) (この著者で検索);Michela Iebole (author) (この著者で検索);Matteo Cialone (author) (この著者で検索);Valeria Braccini (author) (この著者で検索);Koushik Karmakar (author) (この著者で検索);Andrey Maljuk (author) (この著者で検索);Bernd Büchner (author) (この著者で検索);Vadim Grinenko (author) (この著者で検索);Marina Putti (author) (この著者で検索)Federico Caglieris (author) (この著者で検索)
- キーワード
- Inhomogeneities, superconductors, spontaneous hall effect, simulations
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2025-08-22 16:30:24 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900