Room-temperature bulk photovoltaic effect in a terthiophene-based ferroelectric liquid crystal bearing dilactate side chains
- ジャーナル論文
- 著者
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;Masahiro Funahashi (author) (この著者で検索)Kobe University a Department of Chemical Science and Engineering;Yasuko Koshiba (author) (この著者で検索);Shohei Horike (author) (この著者で検索)Shinobu Uemura (author) (この著者で検索)
- キーワード
- Bulk photovoltaic effect, ferroelectric, liquid crystalline semiconductor, oligothiophene, lactate, ferroelectric liquid crystal
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2025-07-16 16:14:58 +0900
Inhomogeneity-driven multiform Spontaneous Hall Effect in conventional and unconventional superconductors
- ジャーナル論文
- 著者
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;Nadia Stegani (author) (この著者で検索)a University of Genoa;Ilaria Pallecchi (author) (この著者で検索);Nicola Manca (author) (この著者で検索);Martina Meinero (author) (この著者で検索);Michela Iebole (author) (この著者で検索);Matteo Cialone (author) (この著者で検索);Valeria Braccini (author) (この著者で検索);Koushik Karmakar (author) (この著者で検索);Andrey Maljuk (author) (この著者で検索);Bernd Büchner (author) (この著者で検索);Vadim Grinenko (author) (この著者で検索);Marina Putti (author) (この著者で検索)Federico Caglieris (author) (この著者で検索)
- キーワード
- Inhomogeneities, superconductors, spontaneous hall effect, simulations
- 刊行年月日
- 2025-12-31
- 更新時刻
- 2025-08-22 16:30:24 +0900
Reorientational dynamics of amino acids in aqueous solution probed by ultrafast optical Kerr effect spectroscopy
- ジャーナル論文
- 著者
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;Koichi Murakami (author) (この著者で検索)University of Tsukuba a Institute of Pure and Applied Sciences;Tomohiro Nobeyama (author) (この著者で検索);Yuta Koda (author) (この著者で検索);Takahiro Sasamori (author) (この著者で検索);Kentaro Shiraki (author) (この著者で検索);Yohei Yamamoto (author) (この著者で検索)Soh Kushida (author) (この著者で検索)
- キーワード
- Amino acids, optical kerr effect spectroscopy, reorientational dynamics
- 刊行年月日
- 2026-09-21
- 更新時刻
- 2026-10-07 11:18:22 +0900
Machine learning prediction of Young's modulus in multi component titanium based biomedical alloys using extended thermodynamic descriptors
- ジャーナル論文
- 著者
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;Hassan Ahmad (author) (この著者で検索)Pakistan Institute of Engineering and Applied Sciences (PIEAS) Department of Metallurgy and Materials Engineering;Muhammad Haider (author) (この著者で検索);Zafar Iqbal (author) (この著者で検索);Muhammad Zarif (author) (この著者で検索)Syed Mujtaba Ul Hassan (author) (この著者で検索)
- キーワード
- Titanium alloys, machine learning, biomedical alloys, Young’s modulus prediction
- 刊行年月日
- 2026-12-31
- 更新時刻
- 2026-07-08 16:58:38 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
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NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900