ファイル種別: application/zip
全ての絞り込みを解除

394 件のレコードが見つかりました。

全ての絞り込みを解除
20210621_30MgO-13#015.png
Original dataset for ID 233 30mol%MgO-70mol%SiO2 in Thermophysical Property Database
データセット
コレクション
Thermophysical Property Original Datasets
著者
Takehiko Ishikawa (depositor) (この著者で検索)
Japan Aerospace Exploration Agency
;
Masashi Ishii (editor) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
30mol%MgO-70mol%SiO2, Ceramic, Density, ISS-ELF, Electrostatic Levitation, collection - Thermophys Datasets
刊行年月日
更新時刻
2024-08-02 12:30:33 +0900
Dataset
Preprocessing Method for Spectra Interpreted by the Power Law Using Segment Regression
ジャーナル論文
著者
ORCID SAMURAI ; ORCID SAMURAI ; ORCID SAMURAI
キーワード
Photoelectron Yield Spectroscopy:, segment regression, Power Law
刊行年月日
2024-11-26
更新時刻
2024-12-04 14:52:47 +0900
2604_supp_info.pdf
Non-negative matrix factorization analysis of spatially-resolved photoemission spectra for epitaxially grown graphene on SiC
ジャーナル論文
著者
Masaki Imamura (author) (この著者で検索)
Saga University Synchrotron Light Application Center
;
Kazutoshi Takahashi (author) (この著者で検索)
キーワード
Photoemission spectroscopy, non-negative matrix factorization, graphene, machine learning, data-driven analysis
刊行年月日
2026-06-19
更新時刻
2026-06-24 15:38:41 +0900
Bisphenol A-responsive microgel comprising hydrophilic poly acrylamide network.pdf
Bisphenol A-responsive microgel comprising hydrophilic poly(acrylamide) network
ジャーナル論文
著者
Akifumi Kawamura (author) (この著者で検索)
Kansai University a Department of Chemistry and Materials Engineering
;
Fumiya Tanaka (author) (この著者で検索)
;
Yuriko Nishimura (author) (この著者で検索)
;
Takashi Miyata (author) (この著者で検索)
キーワード
Molecule-responsive microgel, inverse miniemulsion polymerization, Water-soluble emulsifier, RAFT polymerization, zwitterionic polymer, inclusion complex, Cyclodextrin
刊行年月日
2026-12-31
更新時刻
2026-02-03 15:04:59 +0900
HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
HfO2-Fig6-Work-20230118.pdf
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
National Institute for Materials Science
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
絞り込み