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373 件のレコードが見つかりました。
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:11:29 +0900
International XAFS DB RDF and Ontology
- データセット
- 著者
-
Masashi Ishii (author) (この著者で検索)NIMS Center for Basic Research on Materials
;
Asahiko Matsuda (author) (この著者で検索)NIMS Materials Data Platform
;
;Koichi Sakamoto (author) (この著者で検索)NIMS Center for Basic Research on Materials;Shohei Yamashita (author) (この著者で検索)KEK Institute of Materials Structure ScienceYasuhiro Niwa (author) (この著者で検索)
https://orcid.org/0000-0001-5808-5594
(unauthenticated)
KEK Institute of Materials Structure Science
;
Yasuhiro Inada (author) (この著者で検索)
https://orcid.org/0000-0001-5772-4788
(unauthenticated)
Ritsumeikan University College of Life Sciences
- キーワード
- International XAFS DB portal, Cross-database search, Terminology, Ontology, Semantics, RDF
- 刊行年月日
- 2025-05-01
- 更新時刻
- 2025-07-01 12:30:26 +0900
Preprocessing Method for Spectra Interpreted by the Power Law Using Segment Regression
- ジャーナル論文
- 著者
-
Shinjiro Yagyu (author) (この著者で検索)
;
Michiko Yoshitake (author) (この著者で検索)
;
Takahiro Nagata (author) (この著者で検索)
- キーワード
- Photoelectron Yield Spectroscopy:, segment regression, Power Law
- 刊行年月日
- 2024-11-26
- 更新時刻
- 2024-12-04 14:52:47 +0900
PoLyInfo Conceptual Schema Version 1.1
- データセット
- コレクション
- PoLyInfo Knowledge Collection
- 著者
-
Masashi Ishii (author) (この著者で検索)National Institute for Materials Science
;
Koichi Sakamoto (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Polymer chemistry knowledge, PoLyInfo, Conceptual schema, ShEx, collection - PoLyInfo Knowledge
- 刊行年月日
- 更新時刻
- 2025-05-03 08:30:28 +0900
Program for automatic numerical conversion of a line graph (line plot)
- ジャーナル論文
- 著者
-
YOSHITAKE, Michiko (author) (この著者で検索)
;
;KONO, Takashi (author) (この著者で検索)KADOHIRA, Takuya (author) (この著者で検索)
- キーワード
- Image data, Numerical data, Automatic conversion, Plot with multiple line, Deep learning
- 刊行年月日
- 2020-10-26
- 更新時刻
- 2024-01-05 22:12:23 +0900