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Reference compositions for bismuth telluride thermoelectric materials for low-temperature power generation .pdf
Reference compositions for bismuth telluride thermoelectric materials for low-temperature power generation
ジャーナル論文
著者
Nirma Kumari (author) (この著者で検索)
Korea Electrotechnology Research Institute (KERI) a Energy Conversion Research Center, Electrical Materials Division
;
Jaywan Chung (author) (この著者で検索)
;
Seunghyun Oh (author) (この著者で検索)
;
Jeongin Jang (author) (この著者で検索)
;
Jongho Park (author) (この著者で検索)
;
Ji Hui Son (author) (この著者で検索)
;
SuDong Park (author) (この著者で検索)
;
Byungki Ryu (author) (この著者で検索)
キーワード
Reference composition, Thermoelectric, Bi0.46Sb1.54Te3, Bi2Te2.7Se0.3, BiTe system, Data-Driven
刊行年月日
2025-12-31
更新時刻
2025-11-13 08:30:20 +0900

Dataset
MaterialBERT for Natural Language Processing of Materials Science Texts
ジャーナル論文
著者
KAWANO, Hiroyuki (author) (この著者で検索)
Ridgelinez Limited
;
SATO, Fumitaka (author) (この著者で検索)
Ridgelinez Limited
;
YOSHITAKE, Michiko (author) (この著者で検索)
National Institute for Materials Science MaDIS
ORCID SAMURAI ;
MOTEKI, Fuma (operator) (この著者で検索)
Ridgelinez Limited
;
TERAOKA, Hiroshi (author) (この著者で検索)
Ridgelinez Limited
キーワード
word embedding, pre-training, BERT, literal information
刊行年月日
更新時刻
2025-04-15 08:30:11 +0900

Reproducible chiroptical activity from aggregated chiral thienopyrroledione fluorene   conjugated polymers.pdf
Reproducible Chiroptical Activity from Aggregated Chiral Thienopyrroledione–Fluorene π‑Conjugated Polymers.
ジャーナル論文
著者
Nao Suzuki (author) (この著者で検索)
University of Tsukuba a Institute of Pure and Applied Sciences
;
Ziwei Hu (author) (この著者で検索)
;
Sota Nakayama (author) (この著者で検索)
;
Soh Kushida (author) (この著者で検索)
;
Yohei Yamamoto (author) (この著者で検索)
;
Wijak Yospanya (author) (この著者で検索)
;
Reiko Oda (author) (この著者で検索)
;
Takaki Kanbara (author) (この著者で検索)
;
Junpei Kuwabara (author) (この著者で検索)
キーワード
Chiral π‑conjugated polymer, thienopyrroledione, circular dichroism, circularly polarized luminescence
刊行年月日
2026-06-02
更新時刻
2026-06-19 13:05:19 +0900

HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900

HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900

HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900

HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900

HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900

HfO2-Fig6-Work-20230118.pdf
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900

HfO2-Fig7-Work-20221213.pdf
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900