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Article and Dataset
Collection
Thermophysical Property Original Datasets(1)
Resource type
Dataset(2)
Keyword
Si (2)
Density (1)
Electrostatic Levitation (1)
Metal (1)
SPring-8 BL15 (1)
VELF (1)
XPS (1)
collection - Thermophys Datasets (1)
(more)
License
Creative Commons BY Attribution 4.0 International (1)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
File type
application/zip (2)
image/png (1)
text/plain (1)
Chemical composition
Si (1)
silicon (1)
Measurement method
x-ray photoelectron spectroscopy (1)
dynamic mechanical analysis (1)
Material type
silicon (1)
Structural feature for specimen
melt (1)
Instrument name
VELF (1)
XPS SPring-8 BL15 (1)
Model number
(1)
File type: application/zip
Keyword: Si
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XPS spectral data for p- and n-type Si wafers with various resistivities acquired at SPring-8 BL15
Dataset
Creator
SUMIYA, Masatomo
(author) (
Search by this author
)
https://orcid.org/0000-0003-0960-3812
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
SUMIYA, Masatomo
Keyword
XPS
,
SPring-8 BL15
,
Si
Date published
Updated at
2024-05-24 08:30:24 +0900
Original dataset for ID 12 Si in Thermophysical Property Database
Dataset
Collection
Thermophysical Property Original Datasets
Creator
Takehiko Ishikawa
(depositor) (
Search by this author
)
Japan Aerospace Exploration Agency
Takehiko Ishikawa
;
Masashi Ishii
(editor) (
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)
https://orcid.org/0000-0003-0357-2832
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
Masashi Ishii
Keyword
Si
,
Metal
,
Density
,
VELF
,
Electrostatic Levitation
,
collection - Thermophys Datasets
Date published
Updated at
2024-03-30 18:34:28 +0900
Keyword
Si
(2)
Density
(1)
Electrostatic Levitation
(1)
Metal
(1)
SPring-8 BL15
(1)
VELF
(1)
XPS
(1)
collection - Thermophys Datasets
(1)
RDE metadata def
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Collection
Thermophysical Property Original Datasets(1)
Resource type
Dataset(2)
Keyword
Si (2)
Density (1)
Electrostatic Levitation (1)
Metal (1)
SPring-8 BL15 (1)
VELF (1)
XPS (1)
collection - Thermophys Datasets (1)
(more)
License
Creative Commons BY Attribution 4.0 International (1)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
File type
application/zip (2)
image/png (1)
text/plain (1)
Chemical composition
Si (1)
silicon (1)
Measurement method
x-ray photoelectron spectroscopy (1)
dynamic mechanical analysis (1)
Material type
silicon (1)
Structural feature for specimen
melt (1)
Instrument name
VELF (1)
XPS SPring-8 BL15 (1)
Model number
(1)