14 件のレコードが見つかりました。
Dual quantum spin Hall insulator by density-tuned correlations in TaIrTe4
- ジャーナル論文
- 著者
-
;Jian Tang (author) (この著者で検索);Thomas Siyuan Ding (author) (この著者で検索);Hongyu Chen (author) (この著者で検索);Anyuan Gao (author) (この著者で検索);Tiema Qian (author) (この著者で検索);Zumeng Huang (author) (この著者で検索);Zhe Sun (author) (この著者で検索);Xin Han (author) (この著者で検索);Alex Strasser (author) (この著者で検索);Jiangxu Li (author) (この著者で検索);Michael Geiwitz (author) (この著者で検索);Mohamed Shehabeldin (author) (この著者で検索);Vsevolod Belosevich (author) (この著者で検索);Zihan Wang (author) (この著者で検索);Yiping Wang (author) (この著者で検索)Kenji Watanabe (author) (この著者で検索)National Institute for Materials Science
;
Takashi Taniguchi (author) (この著者で検索)National Institute for Materials Science
;
;David C. Bell (author) (この著者で検索);Ziqiang Wang (author) (この著者で検索);Liang Fu (author) (この著者で検索);Yang Zhang (author) (この著者で検索);Xiaofeng Qian (author) (この著者で検索);Kenneth S. Burch (author) (この著者で検索);Youguo Shi (author) (この著者で検索);Ni Ni (author) (この著者で検索);Guoqing Chang (author) (この著者で検索);Su-Yang Xu (author) (この著者で検索)Qiong Ma (author) (この著者で検索) - キーワード
- Quantum Spin Hall (QSH) Insulator, Electron Correlations, Charge Density Wave (CDW)
- 刊行年月日
- 2024-04-18
- 更新時刻
- 2025-09-05 16:30:37 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:11:29 +0900
Preprocessing Method for Spectra Interpreted by the Power Law Using Segment Regression
- ジャーナル論文
- 著者
-
Shinjiro Yagyu (author) (この著者で検索)
;
Michiko Yoshitake (author) (この著者で検索)
;
Takahiro Nagata (author) (この著者で検索)
- キーワード
- Photoelectron Yield Spectroscopy:, segment regression, Power Law
- 刊行年月日
- 2024-11-26
- 更新時刻
- 2024-12-04 14:52:47 +0900