Quantitative characterization of built-in potential profile across GaAs p–n junctions using Kelvin probe force microscopy with qPlus sensor AFM

ジャーナル論文

著者

Nobuyuki Ishida (author) (この著者で検索)

https://orcid.org/0000-0003-0161-0583

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Nobuyuki Ishida ;

Takaaki Mano (author) (この著者で検索)

https://orcid.org/0000-0002-6955-260X

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Takaaki Mano

キーワード

GaAs(110), Kelvin probe force microscopy, p-n junction, qPlus sensor

刊行年月日

2024-02-05

更新時刻

2024-04-04 08:30:11 +0900