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論文・データセット
コレクション
SuperCon Knowledge Collection(1)
資源タイプ
データセット(15)
キーワード
Auger depth profiling analysis (8)
HfO2/Si (8)
Ultra low angle incidence ion beam (8)
data model (2)
Anomalous X-ray scattering (1)
Glass structure (1)
Metallic glasses (1)
Neutron diffraction (1)
Ontology (1)
Plastic deformation (1)
(more)
ライセンス
In Copyright (8)
Creative Commons BY Attribution 4.0 International (4)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
ファイル種別
application/pdf (15)
application/zip (10)
application/octet-stream (2)
text/plain (2)
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet (1)
application/xml (1)
試料種別
金属・合金 (1)
ファイル種別: application/pdf
資源タイプ: データセット
全ての絞り込みを解除
15 件のレコードが見つかりました。 1件目から10件目まで表示します。
全ての絞り込みを解除
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900
Raw data files for Fig. 8 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7376-6571
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
OGIWARA, Toshiya
;
NAGATA, Takahiro
(author) (
この著者で検索
)
https://orcid.org/0000-0002-8591-2943
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
NAGATA, Takahiro
;
YOSHIKAWA, Hideki
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7389-8865
National Institute for Materials Science
NIMS Researchers Directory SAMURAI
YOSHIKAWA, Hideki
キーワード
Auger depth profiling analysis
,
HfO2/Si
,
Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:11:29 +0900
Plasticity and microstructure of Zr–Cu–Al bulk metallic glasses
データセット
著者
KUMAR, Golden
(author) (
この著者で検索
)
KUMAR, Golden
;
OHKUBO, Tadakatsu
(author) (
この著者で検索
)
https://orcid.org/0000-0003-3548-1951
NIMS Researchers Directory SAMURAI
OHKUBO, Tadakatsu
;
MUKAI, Toshiji
(author) (
この著者で検索
)
https://orcid.org/0000-0002-9628-5762
(unauthenticated)
MUKAI, Toshiji
;
HONO, Kazuhiro
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7367-0193
NIMS Researchers Directory SAMURAI
HONO, Kazuhiro
キーワード
Plastic deformation
,
Shear bands
,
Metallic glasses
刊行年月日
2007-03-28
更新時刻
2024-01-05 22:12:36 +0900
Supplemental data to 'A unified model for metallic materials reliability data and its application in NIMS Metallic Materials Database (Kinzoku)'
データセット
著者
Asahiko Matsuda
(author) (
この著者で検索
)
https://orcid.org/0000-0001-5989-027X
National Institute for Materials Science Research Network and Facility Services Division
NIMS Researchers Directory SAMURAI
Asahiko Matsuda
;
Masahiko Demura
(author) (
この著者で検索
)
https://orcid.org/0000-0002-7308-3041
National Institute for Materials Science Research Network and Facility Services Division
NIMS Researchers Directory SAMURAI
Masahiko Demura
;
Masayoshi Yamazaki
(author) (
この著者で検索
)
National Institute for Materials Science
Masayoshi Yamazaki
;
Takuya Kadohira
(author) (
この著者で検索
)
https://orcid.org/0000-0003-0569-1309
National Institute for Materials Science Research Network and Facility Services Division
NIMS Researchers Directory SAMURAI
Takuya Kadohira
;
Toshihiro Ashino
(author) (
この著者で検索
)
https://orcid.org/0009-0002-9592-8516
(unauthenticated)
Toyo University Faculty of Regional Development Studies
Toshihiro Ashino
;
Yoshiyuki Furuya
(author) (
この著者で検索
)
https://orcid.org/0000-0002-3039-5280
National Institute for Materials Science Research Center for Structural Materials
NIMS Researchers Directory SAMURAI
Yoshiyuki Furuya
;
Kota Sawada
(author) (
この著者で検索
)
https://orcid.org/0000-0001-7780-1648
National Institute for Materials Science Research Center for Structural Materials
NIMS Researchers Directory SAMURAI
Kota Sawada
;
Nobutaka Nishikawa
(author) (
この著者で検索
)
Mizuho Research & Technologies, Ltd.
Nobutaka Nishikawa
キーワード
metallic materials
,
structural materials
,
database
,
data format
,
data model
,
creep
,
fatigue
刊行年月日
2025-12-31
更新時刻
2025-08-01 08:55:21 +0900
キーワード
Auger depth profiling analysis
(8)
HfO2/Si
(8)
Ultra low angle incidence ion beam
(8)
data model
(2)
Anomalous X-ray scattering
(1)
Glass structure
(1)
Metallic glasses
(1)
Neutron diffraction
(1)
Ontology
(1)
Plastic deformation
(1)
RDE
(1)
RDF
(1)
Research Data Express
(1)
Reverse Monte Carlo modeling
(1)
Semantic web
(1)
Shear bands
(1)
Super conductor
(1)
SuperCon
(1)
compound semiconductor
(1)
creep
(1)
data management
(1)
data format
(1)
data structure
(1)
database
(1)
energy loss function
(1)
fatigue
(1)
first-principles calculation
(1)
metallic materials
(1)
optical constant
(1)
process chain
(1)
solid electrolytes
(1)
structural materials
(1)
RDEメタデータ定義
RDE送り状
<
1
2
>
絞り込み
コレクション
SuperCon Knowledge Collection(1)
資源タイプ
データセット(15)
キーワード
Auger depth profiling analysis (8)
HfO2/Si (8)
Ultra low angle incidence ion beam (8)
data model (2)
Anomalous X-ray scattering (1)
Glass structure (1)
Metallic glasses (1)
Neutron diffraction (1)
Ontology (1)
Plastic deformation (1)
(more)
ライセンス
In Copyright (8)
Creative Commons BY Attribution 4.0 International (4)
Creative Commons BY-NC Attribution-NonCommercial 4.0 International (1)
ファイル種別
application/pdf (15)
application/zip (10)
application/octet-stream (2)
text/plain (2)
application/vnd.openxmlformats-officedocument.spreadsheetml.sheet (1)
application/xml (1)
試料種別
金属・合金 (1)