2 件のレコードが見つかりました。
Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces
- ジャーナル論文
- 著者
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Hiroshi Shinotsuka (author) (この著者で検索)National Institute for Materials Science
;
Kenji Nagata (author) (この著者で検索)National Institute for Materials Science
;
Hideki Yoshikawa (author) (この著者で検索)National Institute for Materials Science
;
;Shuichi Ogawa (author) (この著者で検索)Akitaka Yoshigoe (author) (この著者で検索) - キーワード
- Bayesian estimation, X-ray photoelectron spectroscopy, Statistical analysis, Silicon surface oxidation
- 刊行年月日
- 2024-12-03
- 更新時刻
- 2025-01-21 12:30:34 +0900
Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data
- ジャーナル論文
- 著者
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;Atsushi Machida (author) (この著者で検索)Kenji Nagata (author) (この著者で検索)National Institute for Materials Science
;
Ryo Murakami (author) (この著者で検索)National Institute for Materials Science
;
Hiroshi Shinotsuka (author) (この著者で検索)National Institute for Materials Science
;
;Hayaru Shouno (author) (この著者で検索)Hideki Yoshikawa (author) (この著者で検索)National Institute for Materials Science
;
Masato Okada (author) (この著者で検索)
- キーワード
- X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA
- 刊行年月日
- 2024-05-29
- 更新時刻
- 2025-11-10 12:30:27 +0900