Determining the Electron Scattering from Interfacial Coulomb Scatterers in Two-Dimensional Transistors

ジャーナル論文

著者

Yi-Te Lee (author) (この著者で検索)

Yi-Te Lee ;

Yu-Ting Huang (author) (この著者で検索)

Yu-Ting Huang ;

Shao-Pin Chiu (author) (この著者で検索)

Shao-Pin Chiu ;

Ruey-Tay Wang (author) (この著者で検索)

Ruey-Tay Wang ;

Takashi Taniguchi (author) (この著者で検索)

https://orcid.org/0000-0002-1467-3105

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Takashi Taniguchi ;

Kenji Watanabe (author) (この著者で検索)

https://orcid.org/0000-0003-3701-8119

National Institute for Materials Science

NIMS Researchers Directory SAMURAI

Kenji Watanabe ;

Raman Sankar (author) (この著者で検索)

Raman Sankar ;

Chi-Te Liang (author) (この著者で検索)

Chi-Te Liang ;

Wei-Hua Wang (author) (この著者で検索)

Wei-Hua Wang ;

Sheng-Shiuan Yeh (author) (この著者で検索)

Sheng-Shiuan Yeh ;

Juhn-Jong Lin (author) (この著者で検索)

Juhn-Jong Lin

キーワード

electron scattering, 2D materials, Coulomb scattering strength, low-frequency noise, indium selenide, interfacial Coulomb scatterers, 2D transist

刊行年月日

2024-01-10

更新時刻

2025-10-21 15:50:45 +0900