- X-ray photoelectron spectroscopy (4)
- Bayesian estimation (2)
- Automatic spectrum analysis (1)
- Bayesian information criterion (1)
- Exchange Monte Carlo method (1)
- Multiple core level spectra (1)
- SESSA (1)
- Silicon surface oxidation (1)
- Statistical analysis (1)
- dentical-location scanning transmission electron microscopy (1)
4 件のレコードが見つかりました。
Ultraviolet Light-Induced Surface Changes of Tungsten Oxide in Air: Combined Scanning Transmission Electron Microscopy and X-ray Photoelectron Spectroscopy Analysis
- ジャーナル論文
- 著者
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;Yuki Nakagawa (author) (この著者で検索)Fuclty of Engineering, Hokkaido University / 北海道大学 工学研究院;Yasuhiro Shiratsuchi (author) (この著者で検索)Hokkaido University;Tamaki Shibayama (author) (この著者で検索)Fuclty of Engineering, Hokkaido University / 北海道大学 工学研究院Masaki Takeguchi (author) (この著者で検索)National Institute for Materials Science Research Center for Energy and Environmental Materials (GREEN)/Battery and Cell Materials Field/Environment-Controlled Microscopy Group
- キーワード
- tungsten oxide, photocatalysis, dentical-location scanning transmission electron microscopy, X-ray photoelectron spectroscopy, ultraviolet light, hydrocarbon decomposition
- 刊行年月日
- 2024-09-13
- 更新時刻
- 2024-09-20 08:30:15 +0900
Bayesian estimation analysis of X-ray photoelectron spectra: Application to Si 2p spectrum analysis of oxidized silicon surfaces
- ジャーナル論文
- 著者
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Hiroshi Shinotsuka (author) (この著者で検索)National Institute for Materials Science
;
Kenji Nagata (author) (この著者で検索)National Institute for Materials Science
;
Hideki Yoshikawa (author) (この著者で検索)National Institute for Materials Science
;
;Shuichi Ogawa (author) (この著者で検索)Akitaka Yoshigoe (author) (この著者で検索)
- キーワード
- Bayesian estimation, X-ray photoelectron spectroscopy, Statistical analysis, Silicon surface oxidation
- 刊行年月日
- 2024-12-03
- 更新時刻
- 2025-01-21 12:30:34 +0900
Development of multiple core-level XPS spectra decomposition method based on the Bayesian information criterion
- ジャーナル論文
- 著者
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Shinotsuka Hiroshi (author) (この著者で検索)
;
Nagata, Kenji (author) (この著者で検索)
;
;Murakami, Ryo (author) (この著者で検索);Tanaka, Hiromi (author) (この著者で検索);Shouno, Hayaru (author) (この著者で検索)Yoshikawa, Hideki (author) (この著者で検索)
- キーワード
- Automatic spectrum analysis, Bayesian information criterion, Multiple core level spectra, X-ray photoelectron spectroscopy
- 刊行年月日
- 2020-10-03
- 更新時刻
- 2024-01-05 22:13:27 +0900
Bayesian inference method utilizing SESSA in quantitative layer structure estimation from XPS data
- ジャーナル論文
- 著者
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;Atsushi Machida (author) (この著者で検索)Kenji Nagata (author) (この著者で検索)National Institute for Materials Science
;
Ryo Murakami (author) (この著者で検索)National Institute for Materials Science
;
Hiroshi Shinotsuka (author) (この著者で検索)National Institute for Materials Science
;
;Hayaru Shouno (author) (この著者で検索)Hideki Yoshikawa (author) (この著者で検索)National Institute for Materials Science
;
Masato Okada (author) (この著者で検索)
- キーワード
- X-ray photoelectron spectroscopy, Bayesian estimation, Exchange Monte Carlo method, SESSA
- 刊行年月日
- 2024-05-29
- 更新時刻
- 2025-11-10 12:30:27 +0900