22 件のレコードが見つかりました。
Digital-CPDDB
- データセット
- コレクション
- CPDDB
- 著者
-
ABE, Taichi (author) (この著者で検索)
;
HASHIMOTO, Kiyoshi (author) (この著者で検索)
;
;GOTO, Yumi (author) (この著者で検索);SAWADA, Yukiko (author) (この著者で検索)HIROSE, Kiyomi (author) (この著者で検索) - キーワード
- Computational thermodynamics, Phase diagram, CALPHAD
- 刊行年月日
- 2021-08-05
- 更新時刻
- 2022-10-03 01:27:00 +0900
CPDDB
- データセット
- コレクション
- CPDDB
- 著者
-
ABE, Taichi (author) (この著者で検索)
;
HASHIMOTO, Kiyoshi (author) (この著者で検索)
;
;GOTO, Yumi (author) (この著者で検索);SAWADA, Yukiko (author) (この著者で検索)HIROSE, Kiyomi (author) (この著者で検索)
- キーワード
- Computational thermodynamics, Phase diagram, CALPHAD
- 刊行年月日
- 2007-04-01
- 更新時刻
- 2022-10-03 01:50:26 +0900
Effect of Bidentate Ligand Additive in Tin Perovskite Solar Cells
- データセット
- 著者
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Dhruba B. Khadka (author) (この著者で検索)
;
Yasuhiro Shirai (author) (この著者で検索)
;
Masatoshi Yanagida (author) (この著者で検索)
;
Kenjiro Miyano (author) (この著者で検索)
- キーワード
- Sn-perovskite, Sn-oxidation, bidentate ligand, Stability, Device
- 刊行年月日
- 2023-06-11
- 更新時刻
- 2024-09-17 16:30:25 +0900
Local- and Intermediate-Range Atomic Structures of (Ga 2 S 3 ) 0.25 (GeS 2 ) 0.75 Glass: Complementary Use of X-Rays and Neutrons
- データセット
- 著者
-
;Shinya Hosokawa (author) (この著者で検索);Yohei Onodera (author) (この著者で検索);László Pusztai (author) (この著者で検索);Jens Rüdiger Stellhorn (author) (この著者で検索);Hiroo Tajiri (author) (この著者で検索);Kazutaka Ikeda (author) (この著者で検索)Toshiya Otomo (author) (この著者で検索)
- キーワード
- Neutron diffraction, Anomalous X-ray scattering, Reverse Monte Carlo modeling, Glass structure
- 刊行年月日
- 2026-06-12
- 更新時刻
- 2026-06-17 10:24:46 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900