33 件のレコードが見つかりました。
Liquid electrolyte informatics using an exhaustive search with linear regression
- データセット
- 著者
-
SODEYAMA, Keitaro (author) (この著者で検索)National Institute for Materials Science
;
IGARASHI, Yasuhiko (author) (この著者で検索)
https://orcid.org/0000-0003-1042-6657
(unauthenticated)
;
NAKAYAMA, Tomofumi (author) (この著者で検索)
https://orcid.org/0000-0003-1240-3571
(unauthenticated)
;
TATEYAMA, Yoshitaka (author) (この著者で検索)National Institute for Materials Science
;
OKADA, Masato (author) (この著者で検索)
https://orcid.org/0000-0002-9040-8784
(unauthenticated)
- キーワード
- molecules, Li-ion battery, quantum chemistry calculations, materials informatics, Gaussian09, organic solvents
- 刊行年月日
- 2018-06-14
- 更新時刻
- 2024-02-08 17:54:30 +0900
Machine learning prediction of coordination energies for alkali group elements in battery electrolyte solvents
- データセット
- 著者
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ISHIKAWA, Atsushi (author) (この著者で検索)
;
SODEYAMA, Keitaro (author) (この著者で検索)
;
IGARASHI, Yasuhiko (author) (この著者で検索)
https://orcid.org/0000-0003-1042-6657
(unauthenticated)
;
NAKAYAMA, Tomofumi (author) (この著者で検索)
https://orcid.org/0000-0003-1240-3571
(unauthenticated)
;
TATEYAMA, Yoshitaka (author) (この著者で検索)
;
OKADA, Masato (author) (この著者で検索)
https://orcid.org/0000-0002-9040-8784
(unauthenticated)
- キーワード
- quantum chemistry, electrolyte, battery
- 刊行年月日
- 2019-11-18
- 更新時刻
- 2024-01-05 22:13:39 +0900
CPDDB
- データセット
- コレクション
- CPDDB
- 著者
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ABE, Taichi (author) (この著者で検索)
;
HASHIMOTO, Kiyoshi (author) (この著者で検索)
;
;GOTO, Yumi (author) (この著者で検索);SAWADA, Yukiko (author) (この著者で検索)HIROSE, Kiyomi (author) (この著者で検索)
- キーワード
- Computational thermodynamics, Phase diagram, CALPHAD
- 刊行年月日
- 2007-04-01
- 更新時刻
- 2022-10-03 01:50:26 +0900
Digital-CPDDB
- データセット
- コレクション
- CPDDB
- 著者
-
ABE, Taichi (author) (この著者で検索)
;
HASHIMOTO, Kiyoshi (author) (この著者で検索)
;
;GOTO, Yumi (author) (この著者で検索);SAWADA, Yukiko (author) (この著者で検索)HIROSE, Kiyomi (author) (この著者で検索)
- キーワード
- Computational thermodynamics, Phase diagram, CALPHAD
- 刊行年月日
- 2021-08-05
- 更新時刻
- 2022-10-03 01:27:00 +0900
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
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OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:13:20 +0900
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-04-07 22:57:41 +0900
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-01-05 22:12:41 +0900
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-10-08 12:20:27 +0900
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:38 +0900
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
- データセット
- 著者
-
OGIWARA, Toshiya (author) (この著者で検索)National Institute for Materials Science
;
NAGATA, Takahiro (author) (この著者で検索)National Institute for Materials Science
;
YOSHIKAWA, Hideki (author) (この著者で検索)National Institute for Materials Science
- キーワード
- Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
- 刊行年月日
- 2019-03-07
- 更新時刻
- 2024-03-30 18:50:25 +0900