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459 件のレコードが見つかりました。 421件目から430件目まで表示します。

Abstract_2024_応用物理秋_final.pdf
Structural Insights into Thermal Conductivity of Amorphous Germanium Using Topological Data Analysis
プレゼンテーション
著者
Wu YenJu (author) (この著者で検索)
National Institute for Materials Science Center for Basic Research on Materials/Data-driven Materials Research Field/Data-driven Inorganic Materials Group
ORCID SAMURAI ;
Akagi Kazuto (author) (この著者で検索)
WPI-Advanced Institute for Materials Research (AIMR), Tohoku University
;
Goto Masahiro (author) (この著者で検索)
National Institute for Materials Science Research Center for Materials Nanoarchitectonics (MANA)/Nanomaterials Field/Thermal Energy Materials Group
ORCID SAMURAI ;
Xu Yibin (author) (この著者で検索)
National Institute for Materials Science Center for Basic Research on Materials/Data-driven Materials Research Field/Data-driven Inorganic Materials Group
ORCID SAMURAI
キーワード
topological data analysis, amorphous, thermal conductivity, inverse analysis
刊行年月日
更新時刻
2024-10-04 08:30:22 +0900

Manuscript_clean.pdf
Machine learning prediction of Young's modulus in multi component titanium based biomedical alloys using extended thermodynamic descriptors
ジャーナル論文
著者
Hassan Ahmad (author) (この著者で検索)
Pakistan Institute of Engineering and Applied Sciences (PIEAS) Department of Metallurgy and Materials Engineering
;
Muhammad Haider (author) (この著者で検索)
;
Zafar Iqbal (author) (この著者で検索)
;
Muhammad Zarif (author) (この著者で検索)
;
Syed Mujtaba Ul Hassan (author) (この著者で検索)
キーワード
Titanium alloys, machine learning, biomedical alloys, Young’s modulus prediction
刊行年月日
2026-12-31
更新時刻
2026-07-08 16:58:38 +0900

HfO2-Fig12-Work-20230803.pdf
Raw data files for Fig. 12 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:13:20 +0900

HfO2-Fig11-Work-20230710.pdf
Raw data files for Fig. 11 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-04-07 22:57:41 +0900

HfO2-Fig10-Work-20230606.pdf
Raw data files for Fig. 10 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:41 +0900

HfO2-Fig9-Work-20230518.pdf
Raw data files for Fig. 9 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-10-08 12:20:27 +0900

HfO2-Fig5-Work-20230419.pdf
Raw data files for Fig. 5 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:38 +0900

HfO2-Fig6-Work-20230118.pdf
Raw data files for Fig. 6 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-03-30 18:50:25 +0900

HfO2-Fig7-Work-20221213.pdf
Raw data files for Fig. 7 Auger depth profiles in "Auger Depth Profiling Analysis of HfO2/Si Specimen Using an Ultra Low Angle Incidence Ion Beam"
データセット
著者
OGIWARA, Toshiya (author) (この著者で検索)
ORCID SAMURAI ;
NAGATA, Takahiro (author) (この著者で検索)
ORCID SAMURAI ;
YOSHIKAWA, Hideki (author) (この著者で検索)
ORCID SAMURAI
キーワード
Auger depth profiling analysis, HfO2/Si, Ultra low angle incidence ion beam
刊行年月日
2019-03-07
更新時刻
2024-01-05 22:12:25 +0900

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